View Dependent Surface Material Recognition

Author(s):  
Stanislav Mikeš ◽  
Michal Haindl
2018 ◽  
Vol 10 (6) ◽  
pp. 937-950 ◽  
Author(s):  
Huaping Liu ◽  
Jing Fang ◽  
Xinying Xu ◽  
Fuchun Sun

2019 ◽  
Vol 55 (7) ◽  
pp. 1-7 ◽  
Author(s):  
Wendong Zheng ◽  
Bowen Wang ◽  
Huaping Liu ◽  
Xiaodong Wang ◽  
Yongjian Li ◽  
...  

Author(s):  
J. P. Benedict ◽  
R. M. Anderson ◽  
S. J. Klepeis

Ion mills equipped with flood guns can perform two important functions in material analysis; they can either remove material or deposit material. The ion mill holder shown in Fig. 1 is used to remove material from the polished surface of a sample for further optical inspection or SEM ( Scanning Electron Microscopy ) analysis. The sample is attached to a pohshing stud type SEM mount and placed in the ion mill holder with the polished surface of the sample pointing straight up, as shown in Fig 2. As the holder is rotating in the ion mill, Argon ions from the flood gun are directed down at the top of the sample. The impact of Argon ions against the surface of the sample causes some of the surface material to leave the sample at a material dependent, nonuniform rate. As a result, the polished surface will begin to develop topography during milling as fast sputtering materials leave behind depressions in the polished surface.


2019 ◽  
Vol 55 (4) ◽  
pp. 308-321 ◽  
Author(s):  
S. P. Osipov ◽  
E. Yu. Usachev ◽  
S. V. Chakhlov ◽  
S. A. Shchetinkin ◽  
O. S. Osipov

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