On Constant-Time QC-MDPC Decoders with Negligible Failure Rate

Author(s):  
Nir Drucker ◽  
Shay Gueron ◽  
Dusan Kostic
Keyword(s):  
Author(s):  
Antonio Guimarães ◽  
Diego Aranha ◽  
Edson Borin

The emergence of quantum computers is pushing an unprecedented transition in the public key cryptography field. Conventional algorithms, mostly represented by elliptic curves and RSA, are vulnerable to attacks using quantum computers and need, therefore, to be replaced. Cryptosystems based on error-correcting codes are considered some of the most promising candidates to replace them for encryption schemes. Among the code families, QC-MDPC codes achieve the smallest key sizes while maintaining the desired security properties. Their performance, however, still needs to be greatly improved to reach a competitive level. In this work, we focus on optimizing the performance of QC-MDPC code-based cryptosystems through improvements concerning both their implementations and algorithms. We first present a new enhanced version of QcBits' key encapsulation mechanism, which is a constant time implementation of the Niederreiter cryptosystem using QC-MDPC codes. In this version, we updated the implementation parameters to meet the 128-bit quantum security level, replaced some of the core algorithms avoiding slower instructions, vectorized the entire code using the AVX 512 instruction set extension and introduced some other minor improvements. Comparing with the current state-of-the-art implementation for QC-MDPC codes, the BIKE implementation, our code performs 1.9 times faster when decrypting messages. We then optimize the performance of QC-MDPC code-based cryptosystems through the insertion of a configurable failure rate in their arithmetic procedures. We present constant time algorithms with a configurable failure rate for multiplication and inversion over binary polynomials, the two most expensive subroutines used in QC-MDPC implementations. Using a failure rate negligible compared to the security level (2^{-128}), our multiplication is 2 times faster than the one used in the NTL library on sparse polynomials and 1.6 times faster than a naive constant-time sparse polynomial multiplication. Our inversion algorithm, based on the inversion algorithm of Wu et al., is 2 times faster than the original and 12 times faster than the inversion algorithm of Itoh and Tsujii using the same modulus polynomial (x^{32749} - 1). By inserting these algorithms in our enhanced version of QcBits, we were able to achieve a speedup of 1.9 on the key generation and up to 1.4 on the decryption time. Comparing with BIKE, our final version of QcBits performs the uniform decryption 2.7 times faster. Moreover, the techniques presented in this work can also be applied to BIKE, opening new possibilities for further Improvements.


2012 ◽  
Vol 18 (69) ◽  
pp. 237
Author(s):  
فاتن فاروق البدري ◽  
علا علي فرج

تهدف دراسة التوزيعات الإحصائية إلى الحصول على التوصيفات الأفضل لمجموعة المتغيرات والظواهر والتي كل منها يمكن أن يسلك سلوك واحد من هذه التوزيعات. وتعد دراسة عمليات التقدير لمعلمات هذه  التوزيعات من الأمور المهمة والتي لا غنى عنها في دراسة سلوك هذه المتغيرات ونتيجة لذلك جاء هذا البحث محاولة للوصول إلى أفضل طريقة تقدير معلمات توزيع هو واحد من أهم التوزيعات الإحصائية وهو التوزيع الخطي العام لمعدلات الفشل، (Generalized Linear Failure Rate Distribution) وذلك من خلال دراسة الجوانب النظرية بالاعتماد على طرق الاستدلال الإحصائي مثل طريقة الإمكان الأعظم وطريقة المربعات الصغرى وبالإضافة إلى الطريقة المختلطة(طريقة مقترحة) . وتضمن البحث إجراء المقارنات بين طرائق التقدير الثلاثة لمعلمات التوزيع الخطي العام لمعدلات الفشل (GLFRD)، بالاعتماد على مقياسين إحصائيين مهمين هما متوسط مربعات الخطأ (MSE)، ومتوسط الخطأ النسبي المطلق (MAPE)، للحصول على طريقة التقدير الأفضل.


2012 ◽  
Vol 30 (1) ◽  
pp. 119-127
Author(s):  
Henryk Tomaszek ◽  
Ryszard Kaleta ◽  
Mariusz Zieja

The paper is an attempt to describe the forecast on the risk of damages resulting from failures to the means of transport. It has been assumed that the product of the probability of failure (fault) occurrence and measures of effects thereof are to be used to estimate the risk. The below presented dependences that describe the risk of damages have been based on the failure rate. With the available literature as the basis, a preliminary description of the probability of a failure (fault) and the level of losses has been proposed. The paper gives dependences on short- and long-range risk forecasts. To determine the relationship for the probability of a failure (fault), the failure rate has been used.


Author(s):  
Hide Murayama ◽  
Makoto Yamazaki ◽  
Shigeru Nakajima

Abstract Power bipolar devices with gold metallization experience high failure rates. The failures are characterized as shorts, detected during LSI testing at burn-in. Many of these shorted locations are the same for the failed devices. From a statistical lot analysis, it is found that the short failure rate is higher for devices with thinner interlayer dielectric films. Based upon these results, a new electromigration and electrochemical reaction mixed failure mechanism is proposed for the failure.


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