Studio STEM: A Model to Enhance Integrative STEM Literacy Through Engineering Design

Author(s):  
Michael A. Evans ◽  
Christine Schnittka ◽  
Brett D. Jones ◽  
Carol B. Brandt
Author(s):  
Gillian Roehrig ◽  
Khomson Keratithamkul ◽  
Benny Mart R. Hiwatig

Current policy documents across the world call for changes in K-12 science teaching to use integrated STEM strategies to provide a more authentic learning environment for students. Though the importance of integrated STEM education is established through national and international policy documents, there remains disagreement on focus, models, and effective approaches for integrated STEM instruction. A primary focus of STEM policies is addressing STEM workforce issues. However, other important foci for global STEM initiatives are more equitable education, poverty reduction, and increased STEM literacy and awareness. This chapter critiques current implementations of STEM as focused only on technical aspects of engineering design which will not meet any of the goals of integrated STEM. Rather, the authors propose that integration of SSI into STEM lessons will promote the social thinking necessary in engineering design and enhance work toward achieving not only STEM workforce preparation, but also increased STEM literacy and equity within STEM.


Author(s):  
Michael T. Postek

The term ultimate resolution or resolving power is the very best performance that can be obtained from a scanning electron microscope (SEM) given the optimum instrumental conditions and sample. However, as it relates to SEM users, the conventional definitions of this figure are ambiguous. The numbers quoted for the resolution of an instrument are not only theoretically derived, but are also verified through the direct measurement of images on micrographs. However, the samples commonly used for this purpose are specifically optimized for the measurement of instrument resolution and are most often not typical of the sample used in practical applications.SEM RESOLUTION. Some instruments resolve better than others either due to engineering design or other reasons. There is no definitively accurate definition of how to quantify instrument resolution and its measurement in the SEM.


2018 ◽  
Vol 1 (2) ◽  
Author(s):  
Matthew D. Doerfler ◽  
◽  
Katie N. Truitt ◽  
Mark J. Fisher ◽  
Grant Theron ◽  
...  

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