Electrically Impermeable Interface Cracks in Piezoelectric Materials

2017 ◽  
pp. 97-120
Author(s):  
Volodymyr Govorukha ◽  
Marc Kamlah ◽  
Volodymyr Loboda ◽  
Yuri Lapusta
Keyword(s):  
Piezoelectric Materials ◽  
Interface Cracks

Interface cracks in piezoelectric materials

2016 ◽  
Vol 25 (2) ◽  
pp. 023001 ◽  
Author(s):  
V Govorukha ◽  
M Kamlah ◽  
V Loboda ◽  
Y Lapusta
Keyword(s):  
Piezoelectric Materials ◽  
Interface Cracks

Periodic permeable interface cracks in piezoelectric materials

2004 ◽  
Vol 41 (2) ◽  
pp. 323-335 ◽  
Author(s):  
Cun-Fa Gao ◽  
Christoph Häusler ◽  
Herbert Balke
Keyword(s):  
Piezoelectric Materials ◽  
Interface Cracks

On branched interface cracks between two piezoelectric materials

1996 ◽  
Vol 23 (6) ◽  
pp. 615-620 ◽  
Author(s):  
Shun Diao ◽  
Qing Hua Qin ◽  
Jianling Dong
Keyword(s):  
Piezoelectric Materials ◽  
Interface Cracks

scholarly journals Dynamic Response of Multiple Coplanar Interface Cracks between Two Dissimilar Piezoelectric Materials

2004 ◽  
Vol 261-263 ◽  
pp. 477-482 ◽  
Author(s):  
Wen Jie Feng ◽  
Zhi Wen Zou ◽  
R.K.L. Su ◽  
Z.Z. Zou
Keyword(s):  
Dynamic Response ◽  
Piezoelectric Materials ◽  
Singular Integral Equations ◽  
Integral Transforms ◽  
Interface Cracks ◽  
Numerical Examples ◽  
Linear Piezoelectricity ◽  
Cauchy Singular Integral ◽  
Field Integral ◽  
Dynamic Energy Release Rate

The linear piezoelectricity theory is applied to investigate the dynamic response of coplanar interface cracks between two dissimilar piezoelectric materials subjected to the mechanical and electrical impacts. The number of cracks is arbitrary, and the interface cracks are assumed to be permeable for electric field. Integral transforms and dislocation density function are employed to reduce the problem to Cauchy singular integral equations. Numerical examples are given to show the effects of crack relative position and material property parameters on the variations of dynamic energy release rate.

Analysis of Sputtered Zinc Oxide Films

1980 ◽  
Vol 38 ◽  
pp. 416-417
Author(s):  
T. A. Emma ◽  
M. P. Singh
Keyword(s):  
Electron Microscopy ◽  
Zinc Oxide ◽  
Piezoelectric Materials ◽  
Oxide Films ◽  
Optical Quality ◽  
Zno Films ◽  
Rf Power ◽  
X Ray Diffraction ◽  
Sputtered Films ◽  
Zinc Oxide Films

Optical quality zinc oxide films have been characterized using reflection electron diffraction (RED), replication electron microscopy (REM), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Significant microstructural differences were observed between rf sputtered films and planar magnetron rf sputtered films. Piezoelectric materials have been attractive for applications to integrated optics since they provide an active medium for signal processing. Among the desirable physical characteristics of sputtered ZnO films used for this and related applications are a highly preferred crystallographic texture and relatively smooth surfaces. It has been found that these characteristics are very sensitive to the type and condition of the substrate and to the several sputtering parameters: target, rf power, gas composition and substrate temperature.

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