scholarly journals Safety Property Analysis Techniques for Cooperating Embedded Systems Using LTS

2007 ◽  
pp. 114-124 ◽  
Author(s):  
Woo Jin Lee ◽  
Ho-Jun Kim ◽  
Heung Seok Chae
Keyword(s):  
Embedded Systems ◽  
Analysis Techniques ◽  
Property Analysis ◽  
Safety Property

scholarly journals Dependable Software Generation and Execution on Embedded Systems

2020 ◽  
pp. 139-160
Author(s):  
Florian Kriebel ◽  
Kuan-Hsun Chen ◽  
Semeen Rehman ◽  
Jörg Henkel ◽  
Jian-Jia Chen ◽  
...  
Keyword(s):  
Embedded Systems ◽  
Real Time ◽  
Relevant Information ◽  
Real Time Systems ◽  
System Software ◽  
Analysis Techniques ◽  
Functional Aspects ◽  
Depth Analysis ◽  
Time Systems ◽  
Error Masking

AbstractFor generating and executing dependable software, the effects of hardware layer faults at the software layer have to be accurately analyzed and modeled. This requires relevant information from the hardware and software layers, as well as an in-depth analysis of how an application’s outputs are affected by errors, and quantifying the error masking and error propagation on the software layer. Based on this analysis, techniques for generating dependable software can be proposed, e.g., by different dependability-aware compiler-based software transformations or selective instruction protection. Beside functional aspects, timing also plays an important role, as oftentimes tasks have to be finished before a certain deadline to provide useful information, especially in real-time systems. Both aspects are jointly taken into account by the run-time system software which decides—with the help of offline and online-generated data—for multiple concurrently executing applications how to protect and when to execute which application task to optimize for dependability and timing correctness. This is achieved for example by selecting appropriate application versions and protection levels for single and multi-core systems—for example using redundant multithreading (RMT) in different modes—under tolerable performance overhead constraints.

scholarly journals Performance Analysis Techniques for Multi-Soft-Core and Many-Soft-Core Systems

2012 ◽  
Vol 2012 ◽  
pp. 1-14
Author(s):  
David Castells-Rufas ◽  
Eduard Fernandez-Alonso ◽  
Jordi Carrabina
Keyword(s):  
Performance Analysis ◽  
Embedded Systems ◽  
Development Process ◽  
System Development ◽  
Soft Core ◽  
Parallel Applications ◽  
Architectural Support ◽  
Analysis Techniques ◽  
Resource Limitations ◽  
Interesting Solution

Multi-soft-core systems are a viable and interesting solution for embedded systems that need a particular tradeoff between performance, flexibility and development speed. As the growing capacity allows it, many-soft-cores are also expected to have relevance to future embedded systems. As a consequence, parallel programming methods and tools will be necessarily embraced as a part of the full system development process. Performance analysis is an important part of the development process for parallel applications. It is usually mandatory when you want to get a desired performance or to verify that the system is meeting some real-time constraints. One of the usual techniques used by the HPC community is the postmortem analysis of application traces. However, this is not easily transported to the embedded systems based on FPGA due to the resource limitations of the platforms. We propose several techniques and some hardware architectural support to be able to generate traces on multiprocessor systems based on FPGAs and use them to optimize the performance of the running applications.

An example of spectrum imaging used for comparison of EELS quantitative analysis techniques on Al-Li

1991 ◽  
Vol 49 ◽  
pp. 726-727
Author(s):  
John A. Hunt
Keyword(s):  
Quantitative Analysis ◽  
Large Data ◽  
Difference Spectrum ◽  
Large Data Sets ◽  
Foil Thickness ◽  
Data Sets ◽  
Analysis Techniques ◽  
Spectrum Imaging ◽  
Normal Spectrum ◽  
Electron Energy Loss

Spectrum-imaging is a useful technique for comparing different processing methods on very large data sets which are identical for each method. This paper is concerned with comparing methods of electron energy-loss spectroscopy (EELS) quantitative analysis on the Al-Li system. The spectrum-image analyzed here was obtained from an Al-10at%Li foil aged to produce δ' precipitates that can span the foil thickness. Two 1024 channel EELS spectra offset in energy by 1 eV were recorded and stored at each pixel in the 80x80 spectrum-image (25 Mbytes). An energy range of 39-89eV (20 channels/eV) are represented. During processing the spectra are either subtracted to create an artifact corrected difference spectrum, or the energy offset is numerically removed and the spectra are added to create a normal spectrum. The spectrum-images are processed into 2D floating-point images using methods and software described in [1].

Dissociated Σ=27 boundaries in silicon

1988 ◽  
Vol 46 ◽  
pp. 624-625
Author(s):  
A. Garg ◽  
W.A.T. Clark ◽  
J.P. Hirth
Keyword(s):  
Electron Diffraction ◽  
Local Minimum ◽  
Boundary Energy ◽  
Coincidence Site Lattice ◽  
Boundary Plane ◽  
Low Energy ◽  
Theoretical Understanding ◽  
Site Lattice ◽  
Kikuchi Pattern ◽  
Analysis Techniques

In the last twenty years, a significant amount of work has been done in the theoretical understanding of grain boundaries. The various proposed grain boundary models suggest the existence of coincidence site lattice (CSL) boundaries at specific misorientations where a periodic structure representing a local minimum of energy exists between the two crystals. In general, the boundary energy depends not only upon the density of CSL sites but also upon the boundary plane, so that different facets of the same boundary have different energy. Here we describe TEM observations of the dissociation of a Σ=27 boundary in silicon in order to reduce its surface energy and attain a low energy configuration.The boundary was identified as near CSL Σ=27 {255} having a misorientation of (38.7±0.2)°/[011] by standard Kikuchi pattern, electron diffraction and trace analysis techniques. Although the boundary appeared planar, in the TEM it was found to be dissociated in some regions into a Σ=3 {111} and a Σ=9 {122} boundary, as shown in Fig. 1.

Material analysis techniques using the ion mill

1996 ◽  
Vol 54 ◽  
pp. 1034-1035
Author(s):  
J. P. Benedict ◽  
R. M. Anderson ◽  
S. J. Klepeis
Keyword(s):  
Polished Surface ◽  
Surface Material ◽  
Analysis Techniques ◽  
Material Analysis ◽  
Optical Inspection ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis ◽  
Argon Ions ◽  
The Impact ◽  
Scanning Electron

Ion mills equipped with flood guns can perform two important functions in material analysis; they can either remove material or deposit material. The ion mill holder shown in Fig. 1 is used to remove material from the polished surface of a sample for further optical inspection or SEM ( Scanning Electron Microscopy ) analysis. The sample is attached to a pohshing stud type SEM mount and placed in the ion mill holder with the polished surface of the sample pointing straight up, as shown in Fig 2. As the holder is rotating in the ion mill, Argon ions from the flood gun are directed down at the top of the sample. The impact of Argon ions against the surface of the sample causes some of the surface material to leave the sample at a material dependent, nonuniform rate. As a result, the polished surface will begin to develop topography during milling as fast sputtering materials leave behind depressions in the polished surface.

Developmental Sentence Scoring

1984 ◽  
Vol 15 (3) ◽  
pp. 154-168 ◽  
Author(s):  
Mary Ann Lively
Keyword(s):  
Expressive Language ◽  
Analysis Techniques ◽  
Language Analysis ◽  
Scoring Errors

Developmental Sentence Scoring (DSS) is a useful procedure for quantifying thegrammatic structure of children's expressive language. Like most language analysis techniques, however, DSS requires considerable study and practice to use it correctly and efficiently. Clinicians learning DSS tend to make many scoring errors at first and they display similar confusions and mistakes. This article identifies some of these common "problem" areas and provides scoring examples to assist clinicians in learning the DSS procedure.

Creative job analysis techniques of astronaut using archival data

2010 ◽  
Author(s):  
Kathryn Keeton ◽  
Holly Patterson ◽  
Lacey L. Schmidt ◽  
Kelley J. Slack ◽  
Camille Shea
Keyword(s):  
Job Analysis ◽  
Archival Data ◽  
Analysis Techniques
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