A hybrid electron energy loss spectrometer with simultaneous serial and parallel detection

Author(s):  
Jun Yuan ◽  
Zhiway Wang ◽  
Shu Hu ◽  
Ling Xie
Author(s):  
Ondrej L. Krivanek ◽  
Chris E. Meyer ◽  
Marcel Tencé

Elemental maps, that is images showing the concentration of different elements in a sample, can be obtained in an electron microscope equipped with an electron energy-loss spectrometer (EELS) by acquiring and processing data in three dimensions: spatial coordinates x and y, and the energy loss ΔE. Since the electron detector is necessarily at most a two-dimensional one, acquiring all the required data at the same time is not possible. Instead, one can either use an imaging electron spectrometer and acquire a series of whole images at one energy at a time, or use a small probe in a scanning-transmission electron microscope (STEM), and acquire the data image-point by image-point. With a serial-detection spectrometer the data at each image-point must be recorded sequentially, while with a parallel-detection spectrometer a whole spectrum can be recorded at the same time.The two approaches are illustrated schematically in figure 1. The individual sampling points in the three- dimensional volume have been called voxels (by analogy with two-dimensional pixels).


Author(s):  
Eckhard Quandt ◽  
Stephan laBarré ◽  
Andreas Hartmann ◽  
Heinz Niedrig

Due to the development of semiconductor detectors with high spatial resolution -- e.g. charge coupled devices (CCDs) or photodiode arrays (PDAs) -- the parallel detection of electron energy loss spectra (EELS) has become an important alternative to serial registration. Using parallel detection for recording of energy spectroscopic large angle convergent beam patterns (LACBPs) special selected scattering vectors and small detection apertures lead to very low intensities. Therefore the very sensitive direct irradiation of a cooled linear PDA instead of the common combination of scintillator, fibre optic, and semiconductor has been investigated. In order to obtain a sufficient energy resolution the spectra are optionally magnified by a quadrupole-lens system.The detector used is a Hamamatsu S2304-512Q linear PDA with 512 diodes and removed quartz-glas window. The sensor size is 13 μm ∗ 2.5 mm with an element spacing of 25 μm. Along with the dispersion of 3.5 μm/eV at 40 keV the maximum energy resolution is limited to about 7 eV, so that a magnification system should be attached for experiments requiring a better resolution.


2001 ◽  
Vol 7 (S2) ◽  
pp. 908-909
Author(s):  
H.A. Brink ◽  
M. Barfels ◽  
B. Edwards ◽  
P. Burgner

A new type of electron energy loss spectrometer for use with monochromated microscopes is presented. The energy resolution of the spectrometer is better than 0.100 eV. A completely new electron optical design with a number of extra optical elements and advanced tuning software makes it possible to correct spectrum aberrations to 4th order, which increases sensitivity and collection angles. New high-stability electronics make it possible to maintain energy resolution over a period of several minutes in a practical laboratory environment.The energy resolution of Transmission Electron Microscopes (TEMs) equipped with electron energy loss spectrometers is determined by a combination of the energy spread of the electron source, the stability of the microscope’s high voltage power supply, and the energy resolution of the spectrometer. Commercial microscopes usually employ electron sources with an energy distributions of around 0.5 eV or more (FWHM), limiting the energy ultimate energy resolution that can be achieved. Recently FEI constructed a special 200 kV TEM with a built-in monochromator which makes it possible to monochromize the electron source to better than 0.100 eV. A prototype of the presented spectrometer has been installed on this microscope.


Sign in / Sign up

Export Citation Format

Share Document