Electron Beam Induced Current Contrast and Transmission Electron Microscopy Analysis of Special Grain Boundaries in Silicon

Springer Proceedings in Physics - Polycrystalline Semiconductors ◽

10.1007/978-3-642-93413-1_11 ◽

1989 ◽

pp. 83-88 ◽

Cited By ~ 3

Author(s):

J.-L. Maurice ◽

C. Colliex

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Beam ◽

Grain Boundaries ◽

Induced Current ◽

Transmission Electron Microscopy Analysis ◽

Transmission Electron ◽

Electron Microscopy Analysis ◽

Microscopy Analysis ◽

Electron Beam Induced Current

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Structural transformation of grains and grain boundaries with introducing boron atoms into CoPtCr magnetic layer investigated by ultrasoft pseudopotential calculation and transmission electron microscopy analysis

Journal of Applied Physics ◽

10.1063/1.3091285 ◽

2009 ◽

Vol 105 (6) ◽

pp. 063530

Author(s):

Kaoru Shoda ◽

Seiji Takeda

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Grain Boundaries ◽

Structural Transformation ◽

Magnetic Layer ◽

Transmission Electron Microscopy Analysis ◽

Transmission Electron ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Scanning Transmission Electron Microscopy Analysis of Grain Boundaries in Creep-Resistant Yttrium- and Lanthanum-Doped Alumina Microstructures

Journal of the American Ceramic Society ◽

10.1111/j.1151-2916.1999.tb02169.x ◽

2004 ◽

Vol 82 (10) ◽

pp. 2865-2870 ◽

Cited By ~ 33

Author(s):

John Bruley ◽

Junghyun Cho ◽

Helen M. Chan ◽

Martin P. Harmer ◽

Jeffrey M. Rickman

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Grain Boundaries ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron Microscopy Analysis ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Investigation of grain boundaries in BaSi2 epitaxial films on Si(1 1 1) substrates using transmission electron microscopy and electron-beam-induced current technique

Journal of Crystal Growth ◽

10.1016/j.jcrysgro.2012.03.044 ◽

2012 ◽

Vol 348 (1) ◽

pp. 75-79 ◽

Cited By ~ 102

Author(s):

Masakazu Baba ◽

Katsuaki Toh ◽

Kaoru Toko ◽

Noriyuki Saito ◽

Noriko Yoshizawa ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Beam ◽

Grain Boundaries ◽

Epitaxial Films ◽

Induced Current ◽

Current Technique ◽

Transmission Electron ◽

Electron Beam Induced Current

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Transmission electron microscopy analysis of planar faults on (001) planes in MoSi2single crystals

Philosophical Magazine A ◽

10.1080/01418610208240063 ◽

2002 ◽

Vol 82 (14) ◽

pp. 2737-2754 ◽

Cited By ~ 2

Author(s):

Susanne Guder ◽

Martin Bartsch ◽

Ulrich Messerschmidt

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Analysis ◽

Transmission Electron ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Core structure and dissociation energetics of basal edge dislocation in α-Al2O3: A combined atomistic simulation and transmission electron microscopy analysis

Acta Materialia ◽

10.1016/j.actamat.2013.11.035 ◽

2014 ◽

Vol 65 ◽

pp. 76-84 ◽

Cited By ~ 9

Author(s):

Kenji Tsuruta ◽

Eita Tochigi ◽

Yuki Kezuka ◽

Kazuaki Takata ◽

Naoya Shibata ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Edge Dislocation ◽

Atomistic Simulation ◽

Core Structure ◽

Transmission Electron Microscopy Analysis ◽

Transmission Electron ◽

Electron Microscopy Analysis ◽

Microscopy Analysis ◽

Α Al2o3

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Transmission electron microscopy analysis of a TiNx substoichiometric CVD coating

Journal of Materials Science ◽

10.1007/bf00361161 ◽

1993 ◽

Vol 28 (18) ◽

pp. 4957-4961 ◽

Cited By ~ 2

Author(s):

J. L. Derep ◽

E. Beauprez

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Analysis ◽

Transmission Electron ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Rutherford backscattering/channeling and transmission electron microscopy analysis of epitaxial BaF2 films on Ge and InP

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.582495 ◽

1983 ◽

Vol 1 (2) ◽

pp. 246 ◽

Cited By ~ 20

Author(s):

J. M. Phillips

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Rutherford Backscattering ◽

Transmission Electron Microscopy Analysis ◽

Transmission Electron ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Transmission electron microscopy analysis of corroded metal waste forms.

10.2172/861616 ◽

2005 ◽

Cited By ~ 1

Author(s):

N L Dietz

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Analysis ◽

Waste Forms ◽

Metal Waste ◽

Transmission Electron ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Analysis of V defects in GaN-based light emitting diodes by scanning transmission electron microscopy and electron beam induced current

Applied Physics Letters ◽

10.1063/1.2945232 ◽

2008 ◽

Vol 92 (24) ◽

pp. 242103 ◽

Cited By ~ 11

Author(s):

C. L. Progl ◽

C. M. Parish ◽

J. P. Vitarelli ◽

P. E. Russell

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Beam ◽

Scanning Transmission Electron Microscopy ◽

Light Emitting Diodes ◽

Induced Current ◽

Light Emitting ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Beam Induced Current

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Transmission Electron Microscopy Analysis and First-Principles Calculations of Phase Transition from Coesite to Quartz

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2017.14451 ◽

2017 ◽

Vol 17 (9) ◽

pp. 6754-6758

Author(s):

Weiping Liu ◽

Long Chen ◽

Anqi Wang ◽

Dawei Meng ◽

Xiuling Wu ◽

...

Keyword(s):

Electron Microscopy ◽

Phase Transition ◽

Transmission Electron Microscopy ◽

First Principles ◽

First Principles Calculations ◽

Transmission Electron Microscopy Analysis ◽

Transmission Electron ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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