Analysis of V defects in GaN-based light emitting diodes by scanning transmission electron microscopy and electron beam induced current
1989 ◽
Vol 7
(6)
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pp. 3295-3300
2021 ◽
1998 ◽
Vol 16
(2)
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pp. 825-829
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2012 ◽
Vol 348
(1)
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pp. 75-79
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