Improved Test Pattern Generation for Hardware Trojan Detection Using Genetic Algorithm and Boolean Satisfiability

Lecture Notes in Computer Science - Cryptographic Hardware and Embedded Systems -- CHES 2015 ◽

10.1007/978-3-662-48324-4_29 ◽

2015 ◽

pp. 577-596 ◽

Cited By ~ 38

Author(s):

Sayandeep Saha ◽

Rajat Subhra Chakraborty ◽

Srinivasa Shashank Nuthakki ◽

Anshul ◽

Debdeep Mukhopadhyay

Keyword(s):

Genetic Algorithm ◽

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation ◽

Hardware Trojan ◽

Hardware Trojan Detection ◽

Trojan Detection

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Monte Carlo Based Test Pattern Generation for Hardware Trojan Detection

2013 IEEE 11th International Conference on Dependable, Autonomic and Secure Computing ◽

10.1109/dasc.2013.50 ◽

2013 ◽

Cited By ~ 7

Author(s):

Xue Mingfu ◽

Hu Aiqun ◽

Huang Yi ◽

Li Guyue

Keyword(s):

Monte Carlo ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Hardware Trojan ◽

Hardware Trojan Detection ◽

Trojan Detection

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AdaTrust: Combinational Hardware Trojan Detection Through Adaptive Test Pattern Construction

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2021.3053553 ◽

2021 ◽

Vol 29 (3) ◽

pp. 544-557

Author(s):

Chris Nigh ◽

Alex Orailoglu

Keyword(s):

Test Pattern ◽

Hardware Trojan ◽

Adaptive Test ◽

Hardware Trojan Detection ◽

Trojan Detection

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An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.80 ◽

2007 ◽

Cited By ~ 21

Author(s):

Feijun Zheng ◽

Kwang-Ting Cheng ◽

Xiaolang Yan ◽

John Moondanos ◽

Ziyad Hanna

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation

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Hierarchical test pattern generation using a genetic algorithm with a dynamic global reference table

10.1049/cp:19951101 ◽

1995 ◽

Cited By ~ 5

Author(s):

M.J. O'Dare

Keyword(s):

Genetic Algorithm ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Reference Table

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PLAGA: a highly parallelizable genetic algorithm for programmable logic arrays test pattern generation

Proceedings of the 1999 Congress on Evolutionary Computation-CEC99 (Cat. No. 99TH8406) ◽

10.1109/cec.1999.782524 ◽

2003 ◽

Cited By ~ 1

Author(s):

A. Cruz ◽

S. Mukherjee

Keyword(s):

Genetic Algorithm ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Programmable Logic ◽

Programmable Logic Arrays

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Genetic Algorithm for hardware Trojan detection with ring oscillator network (RON)

2015 IEEE International Symposium on Technologies for Homeland Security (HST) ◽

10.1109/ths.2015.7225334 ◽

2015 ◽

Cited By ~ 11

Author(s):

Nima Karimian ◽

Fatemeh Tehranipoor ◽

Md. Tauhidur Rahman ◽

Shane Kelly ◽

Domenic Forte

Keyword(s):

Genetic Algorithm ◽

Ring Oscillator ◽

Hardware Trojan ◽

Hardware Trojan Detection ◽

Trojan Detection ◽

Oscillator Network

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Test pattern generation for worst-case crosstalk faults in DSM chips using Genetic Algorithm

2008 2nd Electronics Systemintegration Technology Conference ◽

10.1109/estc.2008.4684381 ◽

2008 ◽

Author(s):

K.K. Duganapalli ◽

A.K. Palit ◽

W. Anheier

Keyword(s):

Genetic Algorithm ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Worst Case

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GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.511578 ◽

1996 ◽

Vol 15 (8) ◽

pp. 991-1000 ◽

Cited By ~ 74

Author(s):

F. Corno ◽

P. Prinetto ◽

M. Rebaudengo ◽

M. Sonza Reorda

Keyword(s):

Genetic Algorithm ◽

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Synchronous Sequential Circuits

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Parallel test pattern generation using Boolean satisfiability

[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design ◽

10.1109/isvd.1991.185095 ◽

1991 ◽

Cited By ~ 3

Author(s):

V. Sivaramakrishnan ◽

S.C. Seth ◽

P. Agrawal

Keyword(s):

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation ◽

Parallel Test

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Genetic algorithm based test pattern generation for multiple stuck-at faults and test power reduction in VLSI circuits

2014 International Conference on Electronics and Communication Systems (ICECS) ◽

10.1109/ecs.2014.6892760 ◽

2014 ◽

Cited By ~ 4

Author(s):

J. P. Anita ◽

P. T. Vanathi

Keyword(s):

Genetic Algorithm ◽

Test Pattern ◽

Power Reduction ◽

Pattern Generation ◽

Vlsi Circuits ◽

Test Pattern Generation ◽

Test Power ◽

Test Power Reduction

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