X-ray line profile analysis of dislocations and stacking faults in deformed copper

1984 ◽  
Vol 35 (2) ◽  
pp. 109-114 ◽  
Author(s):  
Wang Yuming ◽  
Zhang Ziqung
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Stacking Faults ◽  
Line Profile Analysis ◽  
X Ray

Subgrain Size-Distributions, Dislocation Structures, Stacking- and Twin Faults and Vacancy Concentrations in SPD Materials Determined by X-Ray Line Profile Analysis

2006 ◽  
Vol 503-504 ◽  
pp. 133-140 ◽  
Author(s):  
Tamás Ungár
Keyword(s):  
Plastic Deformation ◽  
Line Profile ◽  
Profile Analysis ◽  
Subgrain Size ◽  
Stacking Faults ◽  
Line Profile Analysis ◽  
Size Distributions ◽  
X Ray ◽  
The Status ◽  
Vacancy Concentrations

The fundamentals of X-ray line profile analysis are summarised in terms of subgrain size and size-distribution, dislocation density and dislocation types, especially edge and screw dislocations, intrinsic and extrinsic stacking faults and twin boundaries and vacancies produced during plastic deformation. It is shown that deformation induced vacancy concentrations in the grain boundaries of compressed copper polycrystals are close to the equilibrium values at the melting temperature. The discrepancy between X-ray and TEM size values is discussed in terms subgrain- and grain size. It is shown that this apparent discrepancy might be used to determine the status of fragmentation by severe plastic deformation.

Microstructure of post-deformed ECAP-Ti investigated by Multiple X-Ray Line Profile Analysis

2006 ◽  
Vol 2006 (suppl_23_2006) ◽  
pp. 129-134 ◽  
Author(s):  
E. Schafler ◽  
K. Nyilas ◽  
S. Bernstorff ◽  
L. Zeipper ◽  
M. Zehetbauer ◽  
...  
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray

scholarly journals X-ray line profile analysis in alakali-treated ramie fiber

2003 ◽  
Vol 60 (6) ◽  
pp. 919-922 ◽  
Author(s):  
K. P. Sao ◽  
B. K. Samantaray ◽  
S. Bhattacherjee
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Ramie Fiber ◽  
Line Profile Analysis ◽  
X Ray

scholarly journals Investigations on Microstructural and Layer Disorder Parameters of Na-Montmorillonite-Glycine Intercalation Compounds

2012 ◽  
Vol 60 (1) ◽  
pp. 25-29 ◽  
Author(s):  
Adnan Hossain Khan ◽  
Parimal Bala ◽  
AFM Mustafizur Rahman ◽  
Mohammad Nurnabi
Keyword(s):  
Crystallite Size ◽  
Chain Length ◽  
Line Profile ◽  
Profile Analysis ◽  
Interlayer Spacing ◽  
Line Profile Analysis ◽  
X Ray ◽  
Microstructural Parameters ◽  
Silicate Layers ◽  
Layer Disorder

Glycine-Montmorillonite (Gly-MMT) composite has been synthesized through intercalation process using Na-Montmorillonite (Na- MMT) and glycine ethylester hydrochloride. Gly-MMT was employed for the synthesis of dipeptide (Gly-Gly-MMT). Microstructural parameters such as crystallite size, r.m.s. strain (<e2>1/2) and layer disorder parameters such as variation of interlayer spacing (g) and proportion of planes affected by such defects (?) of the samples have been calculated by X-ray line profile analysis. In comparison to Na-MMT the basal spacings (d001) of Gly-MMT and Gly-Gly-MMT were reduced by 2.4Å and 1.8Å respectively. The value of d001 of Gly-Gly-MMT (13.3 Å) suggests the monolayer orientation of dipeptide into interlayer spaces. It is also suggested that more homogeneity in the stacking of silicate layers is attained in Gly-Gly-MMT due to the increased chain length of the dipeptide and orientation in monolayer style.DOI: http://dx.doi.org/10.3329/dujs.v60i1.10331Dhaka Univ. J. Sci. 60(1): 25-29, 2012 (January)

Sign in / Sign up

Export Citation Format

Share Document