Operating conditions of an ideal-displacement reactor with recycle

1976 ◽  
Vol 15 (6) ◽  
pp. 826-831
Author(s):  
V. S. Berman ◽  
Yu. P. Gupalo ◽  
A. V. Martirosov ◽  
Yu. S. Ryazantsev
Keyword(s):  
Operating Conditions ◽  
Ideal Displacement ◽  
Displacement Reactor

Calculation of combustion regimes for a twisted gas flow in a tubular ideal displacement reactor

1991 ◽  
Vol 27 (2) ◽  
pp. 211-216
Author(s):  
I. G. Dik ◽  
O. V. Matvienko
Keyword(s):  
Gas Flow ◽  
Ideal Displacement ◽  
Displacement Reactor ◽  
Combustion Regimes

Heat transfer and combustion for a spiral flow in an ideal-displacement reactor

1991 ◽  
Vol 60 (2) ◽  
pp. 171-177 ◽  
Author(s):  
I. G. Dik ◽  
O. V. Matvienko
Keyword(s):  
Heat Transfer ◽  
Spiral Flow ◽  
Ideal Displacement ◽  
Displacement Reactor

Cathodoluminescence of Catalyst Crystallites

1982 ◽  
Vol 40 ◽  
pp. 664-665
Author(s):  
E.D. Boyes ◽  
P.L. Gai ◽  
D.B. Darby ◽  
C. Warwick
Keyword(s):  
Defect Density ◽  
Chemical Properties ◽  
Operating Conditions ◽  
Semiconductor Materials ◽  
Environmental Cell ◽  
High Resolution Structure ◽  
Commercially Important ◽  
Crystallographic Defects ◽  
Resolution Structure

The extended crystallographic defects introduced into some oxide catalysts under operating conditions may be a consequence and accommodation of the changes produced by the catalytic activity, rather than always being the origin of the reactivity. Operation without such defects has been established for the commercially important tellurium molybdate system. in addition it is clear that the point defect density and the electronic structure can both have a significant influence on the chemical properties and hence on the effectiveness (activity and selectivity) of the material as a catalyst. SEM/probe techniques more commonly applied to semiconductor materials, have been investigated to supplement the information obtained from in-situ environmental cell HVEM, ultra-high resolution structure imaging and more conventional AEM and EPMA chemical microanalysis.

Comparison of Deterministic and Linear Cosine Spatial Filtering of Transmission Electron Micrographs

1972 ◽  
Vol 30 ◽  
pp. 596-597
Author(s):  
David A. Ansley
Keyword(s):  
Spherical Aberration ◽  
Focal Length ◽  
Chromatic Aberration ◽  
Spatial Filter ◽  
Operating Conditions ◽  
Objective Lens ◽  
List Type ◽  
Spatial Filters ◽  
Transmission Electron ◽  
Wide Range

The coherence of the electron flux of a transmission electron microscope (TEM) limits the direct application of deconvolution techniques which have been used successfully on unmanned spacecraft programs. The theory assumes noncoherent illumination. Deconvolution of a TEM micrograph will, therefore, in general produce spurious detail rather than improved resolution.A primary goal of our research is to study the performance of several types of linear spatial filters as a function of specimen contrast, phase, and coherence. We have, therefore, developed a one-dimensional analysis and plotting program to simulate a wide 'range of operating conditions of the TEM, including adjustment of the:(1) Specimen amplitude, phase, and separation(2) Illumination wavelength, half-angle, and tilt(3) Objective lens focal length and aperture width(4) Spherical aberration, defocus, and chromatic aberration focus shift(5) Detector gamma, additive, and multiplicative noise constants(6) Type of spatial filter: linear cosine, linear sine, or deterministic

Slow-scan CCD cameras and low-dose High-Resolution Electron Microscopy: Direct and quantitative

1994 ◽  
Vol 52 ◽  
pp. 412-413
Author(s):  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Structural Damage ◽  
Low Dose ◽  
Dynamic Range ◽  
High Resolution Electron Microscopy ◽  
Operating Conditions ◽  
Digital Data ◽  
Ccd Cameras ◽  
Resolution Electron

It has been known for many years that materials such as zeolites, polymers, and biological specimens have crystalline structures that are vulnerable to electron beam irradiation. This radiation damage severely restrains the use of high resolution electron microscopy (HREM). As a result, structural characterization of these materials using HREM techniques becomes difficult and challenging. The emergence of slow-scan CCD cameras in recent years has made it possible to record high resolution (∽2Å) structural images with low beam intensity before any apparent structural damage occurs. Among the many ideal properties of slow-scan CCD cameras, the low readout noise and digital recording allow for low-dose HREM to be carried out in an efficient and quantitative way. For example, the image quality (or resolution) can be readily evaluated on-line at the microscope and this information can then be used to optimize the operating conditions, thus ensuring that high quality images are recorded. Since slow-scan CCD cameras output (undistorted) digital data within the large dynamic range (103-104), they are ideal for quantitative electron diffraction and microscopy.

Simulation and Contrast Analysis of tem Images of Cracks

1990 ◽  
Vol 48 (1) ◽  
pp. 578-579
Author(s):  
D. Goyal ◽  
A. H. King
Keyword(s):  
Displacement Vector ◽  
Crack Tip ◽  
Perfect Crystal ◽  
Operating Conditions ◽  
Displacement Fields ◽  
Fringe Contrast ◽  
Orthogonal Geometry ◽  
Moire Fringe ◽  
Moiré Fringe

TEM images of cracks have been found to give rise to a moiré fringe type of contrast. It is apparent that the moire fringe contrast is observed because of the presence of a fault in a perfect crystal, and is characteristic of the fault geometry and the diffracting conditions in the TEM. Various studies have reported that the moire fringe contrast observed due to the presence of a crack in an otherwise perfect crystal is distinctive of the mode of crack. This paper describes a technique to study the geometry and mode of the cracks by comparing the images they produce in the TEM because of the effect that their displacement fields have on the diffraction of electrons by the crystal (containing a crack) with the corresponding theoretical images. In order to formulate a means of matching experimental images with theoretical ones, displacement fields of dislocations present (if any) in the vicinity of the crack are not considered, only the effect of the displacement field of the crack is considered.The theoretical images are obtained using a computer program based on the two beam approximation of the dynamical theory of diffraction contrast for an imperfect crystal. The procedures for the determination of the various parameters involved in these computations have been well documented. There are three basic modes of crack. Preliminary studies were carried out considering the simplest form of crack geometries, i. e., mode I, II, III and the mixed modes, with orthogonal crack geometries. It was found that the contrast obtained from each mode is very distinct. The effect of variation of operating conditions such as diffracting vector (), the deviation parameter (ω), the electron beam direction () and the displacement vector were studied. It has been found that any small change in the above parameters can result in a drastic change in the contrast. The most important parameter for the matching of the theoretical and the experimental images was found to be the determination of the geometry of the crack under consideration. In order to be able to simulate the crack image shown in Figure 1, the crack geometry was modified from a orthogonal geometry to one with a crack tip inclined to the original crack front. The variation in the crack tip direction resulted in the variation of the displacement vector also. Figure 1 is a cross-sectional micrograph of a silicon wafer with a chromium film on top, showing a crack in the silicon.

Graphical determination of diode operating conditions

1939 ◽  
Vol 9 (35) ◽  
pp. 106
Author(s):  
W.P.N Court
Keyword(s):  
Operating Conditions

Prediction of LPCVD silicon film microstructure from local operating conditions using numerical modeling

1999 ◽  
Vol 09 (PR8) ◽  
pp. Pr8-181-Pr8-188 ◽  
Author(s):  
A. Dollet ◽  
B. Caussat ◽  
J. P. Couderc
Keyword(s):  
Numerical Modeling ◽  
Silicon Film ◽  
Operating Conditions ◽  
Film Microstructure

Numerical analysis of local heat flux and thin-slab solidification in a CSP funnel-type mold with electromagnetic braking

2020 ◽  
Vol 117 (6) ◽  
pp. 602
Author(s):  
Heping Liu ◽  
Jianjun Zhang ◽  
Hongbiao Tao ◽  
Hui Zhang
Keyword(s):  
Heat Flux ◽  
Casting Speed ◽  
Shell Growth ◽  
Local Heat ◽  
Operating Conditions ◽  
Thin Slab ◽  
Wide Face ◽  
Slab Width ◽  
Steel Grades ◽  
Local Heat Flux

In this article, based on the actual monitored temperature data from mold copper plate with a dense thermocouple layout and the measured magnetic flux density values in a CSP thin-slab mold, the local heat flux and thin-slab solidification features in the funnel-type mold with electromagnetic braking are analyzed. The differences of local heat flux, fluid flow and solidified shell growth features between two steel grades of Q235B with carbon content of 0.19%C and DC01 of 0.03%C under varying operation conditions are discussed. The results show the maximum transverse local heat flux is near the meniscus region of over 0.3 m away from the center of the wide face, which corresponds to the upper flow circulation and the large turbulent kinetic energy in a CSP funnel-type mold. The increased slab width and low casting speed can reduce the fluctuation of the transverse local heat flux near the meniscus. There is a decreased transverse local heat flux in the center of the wide face after the solidified shell is pulled through the transition zone from the funnel-curve to the parallel-cure zone. In order to achieve similar metallurgical effects, the braking strength should increase with the increase of casting speed and slab width. Using the strong EMBr field in a lower casting speed might reverse the desired effects. There exist some differences of solidified shell thinning features for different steel grades in the range of the funnel opening region under the measured operating conditions, which may affect the optimization of the casting process in a CSP caster.

Sign in / Sign up

Export Citation Format

Share Document