Determination of the degree of sensitivity of mass-spectrometers to microimpurities

1976 ◽  
Vol 41 (2) ◽  
pp. 740-741 ◽  
Author(s):  
M. L. Aleksandrov ◽  
N. A. Konovalova ◽  
N. S. Pliss
Keyword(s):  
Author(s):  
Y. Taniguchi ◽  
E. Nakazawa ◽  
S. Taya

Imaging energy filters can add new information to electron microscopic images with respect to energy-axis, so-called electron spectroscopic imaging (ESI). Recently, many good results have been reported using this imaging technique. ESI also allows high-contrast observation of unstained biological samples, becoming a trend of the field of morphology. We manufactured a new type of energy filter as a trial production. This energy filter consists of two magnets, and we call γ-filter since the trajectory of electrons shows ‘γ’-shape inside the filter. We evaluated the new energyγ-filter TEM with the γ-filter.Figure 1 shows schematic view of the electron optics of the γ-type energy filter. For the determination of the electron-optics of the γ-type energy filter, we used the TRIO (Third Order Ion Optics) program which has been developed for the design of high resolution mass spectrometers. The TRIO takes the extended fringing fields (EFF) into consideration. EFF makes it difficult to design magnetic energy filters with magnetic sector fields.


1972 ◽  
Vol 77 (10) ◽  
pp. 1987-1990 ◽  
Author(s):  
Alfred O. Nier ◽  
J. L. Hayden ◽  
J. B. French ◽  
N. M. Reid

2008 ◽  
Vol 1123 ◽  
Author(s):  
Karol Putyera ◽  
Kenghsien Su ◽  
Changhsiu Liu ◽  
R. S. Hockett ◽  
Larry Wang

AbstractThe calibration factors are examined for determination of boron (B) and phosphorus (P) in solar grade silicon samples in the new generation of high resolution fast-flow glow-discharge mass spectrometers (FF-GDMS). It is shown that using the generalized calibration factors from the Standard RSF table, the relative errors observed in the determination of these analytes is not acceptably small for photovoltaic applications. The certified B and P values in NIST SRM 57a Si metal sample do not have the confidence intervals, which would be adequate for refining these calibration factors to the acceptable levels. Thus, well-characterized single crystalline Si wafers with known boron and phosphorus contents traceable to NIST reference materials (SRM 2133 and SRM 2137) were used for accurate calibrations and for establishing good analytical procedures for measurements of wide variety of Si sample forms. The obtained results for these important analytes using the new FF-GDMS procedure are compared to other characterization techniques commonly used in this industry.


2016 ◽  
Vol 31 (7) ◽  
pp. 1440-1458 ◽  
Author(s):  
Jochen Vogl ◽  
Björn Brandt ◽  
Janine Noordmann ◽  
Olaf Rienitz ◽  
Dmitriy Malinovskiy

Three different MC-ICPMS instruments were calibrated by means of synthetic isotope mixtures to enable absolute Mg isotope ratios with expanded uncertainties of ≤0.15‰.


2019 ◽  
Vol 263 ◽  
pp. 1-12 ◽  
Author(s):  
Domokos Györe ◽  
Andrew Tait ◽  
Doug Hamilton ◽  
Finlay M. Stuart

1982 ◽  
Vol 28 (6) ◽  
pp. 1309-1313 ◽  
Author(s):  
J W Gramlich ◽  
L A Machlan ◽  
K A Brletic ◽  
W R Kelly

Abstract Thermal-ionization isotope-dilution mass spectrometry is a highly precise and accurate method for the determination of potassium concentrations in serum. Although not suited for routine use because of the time and expense required, the technique provides an extremely valuable tool for the characterization of reference materials and for evaluating other analytical methods. The technique has recently been used to determine the concentration of potassium in a human serum standard, NBS Standard Reference Material 909. Seven vials of the serum were chemically processed and then analyzed by two spectroscopists independently, using different mass spectrometers. The results confirm previous work that indicates that a precision of 0.1% relative can be routinely achieved. The systematic errors in the method have been thoroughly evaluated. When the precise results are thus corrected, they are essentially bias free and hence definitive.


1992 ◽  
Vol 46 (1) ◽  
pp. 42-47
Author(s):  
Stefano Cervelli ◽  
Fernando DiGiovanni ◽  
Luigi Genovese ◽  
Stefano Ferrari

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