The effect of test conditions on apparent smoke density from various materials

1980 ◽  
Vol 16 (2) ◽  
pp. 113-117
Author(s):  
Carlos J. Hilado ◽  
Regina M. Murphy ◽  
Colleen J. Casey
Keyword(s):  
Test Conditions ◽  
Smoke Density

Effects of Fundamental Frequency Contours on Sentence Recognition in Mandarin-Speaking Children With Cochlear Implants

2020 ◽  
Vol 63 (11) ◽  
pp. 3855-3864
Author(s):  
Wanting Huang ◽  
Lena L. N. Wong ◽  
Fei Chen ◽  
Haihong Liu ◽  
Wei Liang
Keyword(s):  
Cochlear Implants ◽  
Fundamental Frequency ◽  
Signal To Noise Ratio ◽  
Lexical Tone ◽  
Signal To Noise ◽  
Sentence Recognition ◽  
Test Conditions ◽  
Age Appropriate ◽  
F0 Contour ◽  
Appropriate Sentences

Purpose Fundamental frequency (F0) is the primary acoustic cue for lexical tone perception in tonal languages but is processed in a limited way in cochlear implant (CI) systems. The aim of this study was to evaluate the importance of F0 contours in sentence recognition in Mandarin-speaking children with CIs and find out whether it is similar to/different from that in age-matched normal-hearing (NH) peers. Method Age-appropriate sentences, with F0 contours manipulated to be either natural or flattened, were randomly presented to preschool children with CIs and their age-matched peers with NH under three test conditions: in quiet, in white noise, and with competing sentences at 0 dB signal-to-noise ratio. Results The neutralization of F0 contours resulted in a significant reduction in sentence recognition. While this was seen only in noise conditions among NH children, it was observed throughout all test conditions among children with CIs. Moreover, the F0 contour-induced accuracy reduction ratios (i.e., the reduction in sentence recognition resulting from the neutralization of F0 contours compared to the normal F0 condition) were significantly greater in children with CIs than in NH children in all test conditions. Conclusions F0 contours play a major role in sentence recognition in both quiet and noise among pediatric implantees, and the contribution of the F0 contour is even more salient than that in age-matched NH children. These results also suggest that there may be differences between children with CIs and NH children in how F0 contours are processed.

Top-Down Processing and Visual Reorientation Illusions in a Virtual Reality Environment

2004 ◽  
Vol 63 (3) ◽  
pp. 143-149 ◽  
Author(s):  
Fred W. Mast ◽  
Charles M. Oman
Keyword(s):  
Virtual Reality ◽  
Visual Processing ◽  
Line Length ◽  
Perceptual Cues ◽  
Virtual Reality Environment ◽  
Top Down ◽  
Test Conditions ◽  
The Subject ◽  
Processing Mechanisms

The role of top-down processing on the horizontal-vertical line length illusion was examined by means of an ambiguous room with dual visual verticals. In one of the test conditions, the subjects were cued to one of the two verticals and were instructed to cognitively reassign the apparent vertical to the cued orientation. When they have mentally adjusted their perception, two lines in a plus sign configuration appeared and the subjects had to evaluate which line was longer. The results showed that the line length appeared longer when it was aligned with the direction of the vertical currently perceived by the subject. This study provides a demonstration that top-down processing influences lower level visual processing mechanisms. In another test condition, the subjects had all perceptual cues available and the influence was even stronger.

Patterns of Incorporation of 75Se-Methionine into Fibrinogen and Other Plasma Proteins in Rabbits Stimulated by Different Test Conditions

1973 ◽  
Vol 29 (01) ◽  
pp. 076-086 ◽  
Author(s):  
Uri Seligsohn ◽  
Samuel I. Rapaport ◽  
Ariella Zivelin
Keyword(s):  
Growth Hormone ◽  
Plasma Proteins ◽  
Tissue Injury ◽  
Injury Pattern ◽  
Experimental Conditions ◽  
Test Conditions

SummaryRabbits were injected with 75Se-Methionine (75SeM) 4-8 hr after being subjected to a variety of experimental conditions: injection of ACTH, growth hormone, glucagon, adrenalin, endotoxin, turpentine, hydrocortisone and laparotomy. All of these experimental conditions except injection of glucagon were associated with increased incorporation of 75SeM into fibrinogen. Three patterns of incorporation of 75SeM into plasma proteins were recognized: 1. the pituitary pattern, which was observed in animals injected with ACTH, growth hormone or endotoxin, and which was characterized by increased incorporation of 75SeM only into fibrinogen and by a delayed incorporation of 75SeM into α2 and β1 globulins; 2. the tissue injury pattern, which was characterized by a markedly increased incorporation of 75SeM into fibrinogen and no alteration in incorporation of 75SeM into α2 or β1 globulins; and 3. the pharmacologic corticosteroid pattern, which was characterized by a moderately increased incorporation of 75SeM into fibrinogen and a strikingly increased incorporation of 75SeM into α2 and β1 globulins.

Experimental Characterization of the Reliability of 3-Terminal Dual-Damascene Copper Interconnect Trees

2002 ◽  
Vol 716 ◽  
Author(s):  
C. L. Gan ◽  
C. V. Thompson ◽  
K. L. Pey ◽  
W. K. Choi ◽  
F. Wei ◽  
...  
Keyword(s):  
Stress Conditions ◽  
Experimental Characterization ◽  
Contact Lines ◽  
Tree Structures ◽  
Similar Test ◽  
Dual Damascene ◽  
Copper Interconnect ◽  
Test Conditions

AbstractElectromigration experiments have been carried out on simple Cu dual-damascene interconnect tree structures consisting of straight via-to-via (or contact-to-contact) lines with an extra via in the middle of the line. As with Al-based interconnects, the reliability of a segment in this tree strongly depends on the stress conditions of the connected segment. Beyond this, there are important differences in the results obtained under similar test conditions for Al-based and Cu-based interconnect trees. These differences are thought to be associated with variations in the architectural schemes of the two metallizations. The absence of a conducting electromigrationresistant overlayer in Cu technology, and the possibility of liner rupture at stressed vias lead to significant differences in tree reliabilities in Cu compared to Al.

The Driving Severity Number (DSN) — A Step Toward Quantifying Treadwear Test Conditions

1986 ◽  
Vol 14 (3) ◽  
pp. 139-159 ◽  
Author(s):  
A. G. Veith
Keyword(s):  
Signal Processing ◽  
Ambient Temperature ◽  
Lateral Acceleration ◽  
Force Distribution ◽  
Single Index ◽  
Tire Force ◽  
Test Conditions ◽  
Wheel Revolution ◽  
High Degree ◽  
Revolution Counter

Abstract A system, called the “Driving Severity Monitor” (DSM), has been developed for characterizing tire force distribution as related to treadwear in either normal tire use or in tire fleet testing in a convoy. The system consists of an accelerometer for monitoring lateral accelerations, a wheel revolution counter, and a module for signal processing and read-out. The output of the DSM is reduced to a single index, the Driving Severity Number (DSN), which characterizes a vehicle journey. The DSN is equal to the sum of squares of lateral acceleration measured once per tire revolution during a trip, divided by the number of wheel revolutions. The DSN had a high degree of correlation (R ≧ 0.95) with treadwear in two wear programs when pavement abrasiveness was held constant. This supports the concept that the three basic treadwear components: tire force distribution, pavement abrasiveness, and ambient temperature, can be separated for better understanding of tire treadwear.

Application of Conductive-AFM in Soft Failure Analysis

2017 ◽  
Author(s):  
Chuan Zhang ◽  
Yinzhe Ma ◽  
Gregory Dabney ◽  
Oh Chong Khiam ◽  
Esther P.Y. Chen
Keyword(s):  
Failure Analysis ◽  
Conductive Atomic Force Microscopy ◽  
Test Parameter ◽  
Conductive Afm ◽  
Force Microscopy ◽  
Analysis Methodology ◽  
Soft Failure ◽  
Atomic Force ◽  
Test Conditions ◽  
Sensitive Characteristics

Abstract Soft failures are among the most challenging yield detractors. They typically show test parameter sensitive characteristics, which would pass under certain test conditions but fail under other conditions. Conductive-atomic force microscopy (CAFM) emerged as an ideal solution for soft failure analysis that can balance the time and thoroughness. By inserting CAFM into the soft failure analysis flow, success rate of such type of analysis can be significantly enhanced. In this paper, a logic chain soft failure and a SRAM local bitline soft failure are used as examples to illustrate how this failure analysis methodology provides a powerful and efficient solution for soft failure analysis.

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