Transmission electron microscopy study of stress- ruptured aged 304h stainless steel after prolonged exposure in service

Journal of Materials Engineering and Performance ◽

10.1007/bf02646903 ◽

1996 ◽

Vol 5 (6) ◽

pp. 691-694 ◽

Author(s):

A Sengupta ◽

M Balogh

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Stainless Steel ◽

Prolonged Exposure ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Ion bombardment induced amorphous layers on single crystal stainless steel-a combined rutherford backscattering and transmission electron microscopy study

Radiation Effects ◽

10.1080/00337578008243069 ◽

1980 ◽

Vol 49 (1-3) ◽

pp. 65-69 ◽

Author(s):

W. A. Grant ◽

J. L. Whitton ◽

J. S. Williams

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Stainless Steel ◽

Single Crystal ◽

Ion Bombardment ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Rutherford Backscattering ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study on silicon nitride/stainless steel bonded interfaces

Thin Solid Films ◽

10.1016/j.tsf.2008.08.113 ◽

2008 ◽

Vol 517 (2) ◽

pp. 779-781 ◽

Author(s):

P. Poza ◽

P. Miranzo ◽

M.I. Osendi

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Stainless Steel ◽

Silicon Nitride ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission Electron Microscopy Study of S phase in Low Temperature Plasma Nitrided 316 Stainless Steel

Stainless Steel 2000 ◽

10.1201/9780367814151-22 ◽

2020 ◽

pp. 215-228

Author(s):

X.Y. Li ◽

Y. Sun

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Stainless Steel ◽

Low Temperature ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Low Temperature Plasma ◽

Transmission Electron Microscopy Study ◽

Temperature Plasma ◽

Transmission Electron

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High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

Philosophical Magazine A ◽

10.1080/01418610110087291 ◽

2002 ◽

Vol 82 (4) ◽

pp. 735-749 ◽

Author(s):

J. Y.Huang ◽

B. H. Park ◽

David Jan ◽

X. Q. Pan ◽

Yuntian T. Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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A SCANNING AND TRANSMISSION ELECTRON MICROSCOPY STUDY OF POOL BOILING SURFACES

10.1615/ihtc4.140 ◽

1970 ◽

Author(s):

G. H. Nix ◽

R.I. Vachon ◽

D. M. Hall

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Pool Boiling ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of a precipitate which forms in the Al-Mg-Si system

Philosophical Magazine Letters ◽

10.1080/095008396180407 ◽

1996 ◽

Vol 74 (2) ◽

pp. 57-66 ◽

Author(s):

L. Sagalowicz ◽

G. Lapasset ◽

G. Hug

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In Situ Scanning Transmission Electron Microscopy Study of MoS2 Formation on Graphene with a Deep-Learning Framework

ACS Omega ◽

10.1021/acsomega.1c03002 ◽

2021 ◽

Author(s):

Yeongdong Lee ◽

Jongyeong Lee ◽

Handolsam Chung ◽

Jaemin Kim ◽

Zonghoon Lee

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Learning Framework ◽

Transmission Electron ◽

Scanning Transmission

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In Situ Transmission Electron Microscopy Study on the Deformation Responses of Additively Manufactured Multiphase Ni-based Superalloy

Microscopy and Microanalysis ◽

10.1017/s1431927620019571 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1844-1846

Author(s):

Qianying Guo ◽

Michael M. Kirka ◽

Kinga A. Unocic

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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An in-situ and ex-situ transmission electron microscopy study of the substrate orientational dependence of the solid-phase epitaxial growth of amorphized GaAs

1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings ◽

10.1109/commad.1996.610160 ◽

2002 ◽

Author(s):

K.B. Belay ◽

M.C. Ridgway ◽

D.J. Llewellyn

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Epitaxial Growth ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Ex Situ ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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A scanning electron microscopy/transmission electron microscopy study of the photocrystallization of amorphous silicon

Journal of Applied Physics ◽

10.1063/1.331800 ◽

1983 ◽

Vol 54 (10) ◽

pp. 5760-5763 ◽

Author(s):

A. Prasad ◽

K. Ebihara ◽

P. K. John ◽

B. Y. Tong ◽

S. K. Wong ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Transmission Electron Microscopy ◽

Amorphous Silicon ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Scanning Electron

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