Theory of the near-probe layer in electronegative gases

2000 ◽  
Vol 73 (2) ◽  
pp. 311-317 ◽  
Author(s):  
S. A. Gutsev
Keyword(s):  
Probe Layer

Probe layer measurements of electroluminescence excitation in ac thin‐film devices

1981 ◽  
Vol 52 (5) ◽  
pp. 3590-3599 ◽  
Author(s):  
V. Marrello ◽  
L. Samuelson ◽  
A. Onton ◽  
W. Reuter
Keyword(s):  
Thin Film ◽  
Probe Layer ◽  
Thin Film Devices

Ion irradiated polystyrene: transport and hardness Measurements

1994 ◽  
Vol 354 ◽  
Author(s):  
Robert H. Folk II ◽  
David E. Luzzi ◽  
Russell J. Composto ◽  
J. Bruce Rothmant
Keyword(s):  
Thin Films ◽  
Ion Irradiation ◽  
Force Microscopy ◽  
Polymer Adhesion ◽  
Atomic Force ◽  
Large Hysteresis ◽  
Relative Hardness ◽  
Force Displacement ◽  
Ion Species ◽  
Probe Layer

AbstractThin films of polystyrene (PS) were modified using oxygen (0+) and helium (He+) ions and analyzed via diffusion and hardness measurements. One micron thick films were modified with 400 keV 0+ and He+ ions. The fluence was varied from 1.7 to 34.0 x 1013 ions/cm2 for both incident ions. Following irradiation, some samples were covered with a probe layer of deuterated PS, and annealed at 170°C. Using forward recoil spectrometry, the diffusion of d-PS and the PS hydrogen loss were measured as a function of incident ion species and dose. For all modified samples, d-PS diffusion was significantly retarded compared to the unmodified case. Atomic force microscopy measurements on the as-cast and irradiated PS samples suggest that the relative hardness of the 0+ modified PS was greater than that of the as-cast PS. The force-displacement curves of the modified PS displayed no hysteresis whereas the as-cast PS had a large hysteresis due to tip penetration and tip-polymer adhesion. These results indicate that ion irradiation decreases transport in PS and increases PS hardness.

Excitation efficiency in thin‐film electroluminescent devices: Probe layer measurements

1993 ◽  
Vol 73 (3) ◽  
pp. 1435-1442 ◽  
Author(s):  
J. Benoit ◽  
C. Barthou ◽  
P. Benalloul
Keyword(s):  
Thin Film ◽  
Electroluminescent Devices ◽  
Excitation Efficiency ◽  
Probe Layer

A molecular probe layer modified organic thin film transistor on flexible platform for next generation cyanide sensor

2021 ◽  
Vol 99 ◽  
pp. 106341
Author(s):  
Sudipta Kumar Sarkar ◽  
Ajay Kumar Botcha ◽  
Dipti Gupta
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Molecular Probe ◽  
Organic Thin Film ◽  
Next Generation ◽  
Organic Thin Film Transistor ◽  
Probe Layer

Micro Contact Printing of DNA Molecules

2004 ◽  
Author(s):  
H. Zhou ◽  
K. Ma ◽  
G. Jia ◽  
J. Zoval ◽  
M. Madou
Keyword(s):  
Plant Breeding ◽  
Surface Density ◽  
Genetic Disorders ◽  
Rapid Identification ◽  
Dna Probes ◽  
Dna Sensors ◽  
Contact Printing ◽  
Main Challenge ◽  
Human Genetic Disorders ◽  
Probe Layer

The development of DNA sensors has attracted substantial research efforts. Such devices could be used for the rapid identification of pathogens in humans, animals, and plant; in the detection of specific genes in animal and plant breeding; and in the diagnosis of human genetic disorders. The first step to fabricate the DNA sensors is the probe immobilization on the suitable substrate. Traditionally, the DNA probes are spotted on the substrate while the technique hardly controlled the small pattern and surface density of DNA probes. The main challenge here is to achieve probe layer uniformity and the nature of the probe layer itself in few micron and sub-micron feature range.

scholarly journals Magnetic Anisotropy in Co/Nd Multilayers with Depth-Selectively Inserted57Fe Probe Layer

2000 ◽  
Vol 97 (3) ◽  
pp. 439-442 ◽  
Author(s):  
L.T. Baczewski ◽  
K. Mibu ◽  
T. Nagahama ◽  
T. Shinjo
Keyword(s):  
Magnetic Anisotropy ◽  
Probe Layer

Measurement of K-shell population of swift sulphur ions penetrating Fe and Ni foils using the probe layer technique

1993 ◽  
Vol 27 (2) ◽  
pp. 143-148 ◽  
Author(s):  
L. C. Tribedi ◽  
K. G. Prasad ◽  
P. N. Tandon
Keyword(s):  
Layer Technique ◽  
Probe Layer

Probe Technique for Measuring the Bohm Coefficient, Space-Charge Probe Layer Thickness, and Ion Mass

2018 ◽  
Vol 63 (12) ◽  
pp. 1743-1748
Author(s):  
P. E. Masherov ◽  
V. A. Ryabyi
Keyword(s):  
Space Charge ◽  
Layer Thickness ◽  
Probe Technique ◽  
Coefficient Space ◽  
Probe Layer

MÖssbauer Measurements of Interfacial Magnetism of MBE Grown FE(100)/AG(100) Multilayers

1991 ◽  
Vol 231 ◽  
Author(s):  
H. Tang ◽  
M.D. Wieczorek ◽  
D.J. Keavney ◽  
D.F. Storm ◽  
C.J. Gutierrez ◽  
...  
Keyword(s):  
Mössbauer Spectroscopy ◽  
Hyperfine Field ◽  
Temperature Dependence ◽  
Layer Thickness ◽  
Mossbauer Spectroscopy ◽  
Mößbauer Spectroscopy ◽  
Mössbauer Measurements ◽  
Fe Sites ◽  
Probe Layer

AbstractMultilayers of Fe(100)/Ag(100) were grown by MBE and analyzed with in situ RHEED and MÖssbauer spectroscopy. These films had a constant Ag layer thickness of 40 monolayers (ML) and varying Fe layer thicknesses of 3, 6, and 9 ML. Using MÖssbauer spectroscopy the presence of three Fe sites was inferred. From considerations of the hyperflne parameters and the relative intensities of the sextets, we assign one site to the bulk, and one to each interface: Fe on Ag and Ag on Fe. We believe that one explanation of this is differing tetragonal distortions at the two interfaces. Consequently, another series of films was grown in an attempt to distinguish these sites. These films were essentially identical to the 9 ML film above, but the Fe layers were composed of 56Fe, with a 2 ML 57Fe probe layer effused at the bulk and at each interface in turn. At this point 57Fe MÖssbauer spectroscopy was used to determine the hyperfine field and its temperature dependence for each of the three sites.

scholarly journals Impedance-based detection of DNA sequences using a silicon transducer with PNA as the probe layer

2004 ◽  
Vol 32 (2) ◽  
pp. 20e-20 ◽  
Author(s):  
A. Macanovic
Keyword(s):  
Dna Sequences ◽  
Probe Layer
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