Nanometer-sized patterning of polysilicon thin films by high density plasma etching using Cl2 and hbr gases

2003 ◽  
Vol 20 (6) ◽  
pp. 1138-1141 ◽  
Author(s):  
Young Soo Song ◽  
Chee Won Chung

2004 ◽  
Vol 467 (1-2) ◽  
pp. 172-175 ◽  
Author(s):  
Young Soo Song ◽  
Jung Woo Kim ◽  
Chee Won Chung






2006 ◽  
Vol 84 (1) ◽  
pp. 169-177
Author(s):  
JANG WOO LEE ◽  
SU RYUN MIN ◽  
HAN NA CHO ◽  
CHEE WON CHUNG


1999 ◽  
Vol 596 ◽  
Author(s):  
K. P. Lee ◽  
K. B. Jung ◽  
A Srivastava ◽  
D. Kumar ◽  
R. K. Singh ◽  
...  

AbstractHigh density plasma etching of (Ba,Sr)TiO3 (BST) and LaNiO3 (LNO) thin films was performed in two different plasma chemistries, Cl2/Ar and CH4/H2/Ar. While the latter chemistry produced extremely low etch rates (≤ 100 Å-min−1) under all conditions, the Cl2/Ar produced a smooth anisotropic pattern transfer. The etching was still strongly ion-assisted, but maximum removal rates of ∼900 Å min−1 for both materials were achieved with selectivities of ∼16 for BST and ∼7 for LNO over Si. A single layer of thick (∼7 μm) photoresist is an effective mask under these conditions.



1999 ◽  
Vol 17 (4) ◽  
pp. 2156-2161 ◽  
Author(s):  
Seung-Bum Kim ◽  
Chang-Il Kim ◽  
Eui-Goo Chang ◽  
Geun-Young Yeom


2003 ◽  
Vol 150 (5) ◽  
pp. G297 ◽  
Author(s):  
Chee Won Chung ◽  
Hye In Kim ◽  
Young Soo Song


2020 ◽  
Vol 7 (10) ◽  
pp. 106301
Author(s):  
Liting Zhang ◽  
Young-Hee Joo ◽  
Doo-Seung Um ◽  
Chang-Il Kim


1999 ◽  
Vol 28 (4) ◽  
pp. 347-354 ◽  
Author(s):  
C. R. Eddy ◽  
D. Leonhardt ◽  
V. A. Shamamian ◽  
J. R. Meyer ◽  
C. A. Hoffman ◽  
...  


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