Parallel test pattern generation using circuit partitioning in a shared-memory multiprocessor

Lecture Notes in Computer Science - Applied Parallel Computing Large Scale Scientific and Industrial Problems ◽

10.1007/bfb0095334 ◽

1998 ◽

pp. 167-171 ◽

Author(s):

Consolación Gil ◽

Julio Ortega ◽

Jose Luis Bernier ◽

Maria Dolores Gil

Keyword(s):

Shared Memory ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Circuit Partitioning ◽

Parallel Test ◽

Shared Memory Multiprocessor

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Bit parallel test pattern generation for path delay faults

Proceedings the European Design and Test Conference. ED&TC 1995 ◽

10.1109/edtc.1995.470351 ◽

2002 ◽

Author(s):

M. Henftling ◽

H. Wittman

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Faults ◽

Path Delay Faults ◽

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Suppressing test inflation in shared-memory parallel Automatic Test Pattern Generation

2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) ◽

10.1109/aspdac.2014.6742967 ◽

2014 ◽

Author(s):

Jerry C. Y. Ku ◽

Ryan H.-M. Huang ◽

Louis Y.-Z. Lin ◽

Charles H.-P. Wen

Keyword(s):

Shared Memory ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Parallel test pattern generation using Boolean satisfiability

[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design ◽

10.1109/isvd.1991.185095 ◽

1991 ◽

Author(s):

V. Sivaramakrishnan ◽

S.C. Seth ◽

P. Agrawal

Keyword(s):

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation ◽

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P4-TPG: Accelerating Deterministic Parallel Test Pattern Generation by Preemptive, Proactive, and Preventive Schedulings

IEEE Access ◽

10.1109/access.2018.2890112 ◽

2019 ◽

Vol 7 ◽

pp. 6816-6830

Author(s):

Louis Y.-Z. Lin ◽

Charles Chia-Hao Hsu ◽

Charles H.-P. Wen

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

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Accelerated test pattern generation by cone-oriented circuit partitioning

Proceedings of the European Design Automation Conference, 1990., EDAC. ◽

10.1109/edac.1990.136684 ◽

2002 ◽

Author(s):

T. Gruning ◽

U. Mahlstedt ◽

W. Daehn ◽

C. Ozcan

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Circuit Partitioning ◽

Accelerated Test

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Parallelization methods for circuit partitioning based parallel automatic test pattern generation

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313305 ◽

2002 ◽

Author(s):

R.H. Klenke ◽

R.D. Williams ◽

J.H. Aylor

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Circuit Partitioning ◽

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A Parallel Test Pattern Generation Algorithm to Meet Multiple Quality Objectives

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2157693 ◽

2011 ◽

Vol 30 (11) ◽

pp. 1767-1772 ◽

Author(s):

Kuan-Yu Liao ◽

Chia-Yuan Chang ◽

J. C-M Li

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm ◽

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Test pattern generation for logic crosstalk faults in VLSI circuits

IEE Proceedings G Circuits Devices and Systems ◽

10.1049/ip-g-2.1991.0034 ◽

1991 ◽

Vol 138 (2) ◽

pp. 179 ◽

Author(s):

A. Rubio ◽

J.A. Sainz ◽

K. Kinoshita

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Vlsi Circuits ◽

Test Pattern Generation

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Test the S27 Benchmark Circuit by Using Built In Self Test and Test Pattern Generation

International Journal of Advanced Research in Electrical Electronics and Instrumentation Engineering ◽

10.15662/ijareeie.2014.0308083 ◽

2014 ◽

Vol 03 (08) ◽

pp. 11487-11495

Author(s):

S. Nagaraju ◽

Ch.N.L. Sujatha ◽

J.S.S. Ramaraju

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Benchmark Circuit ◽

Self Test ◽

Built In Self Test

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Machine Intelligence for Efficient Test Pattern Generation

2020 IEEE International Test Conference (ITC) ◽

10.1109/itc44778.2020.9325250 ◽

2020 ◽

Author(s):

Soham Roy ◽

Spencer K. Millican ◽

Vishwani D. Agrawal

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Machine Intelligence ◽

Test Pattern Generation ◽

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