Parallel test pattern generation using circuit partitioning in a shared-memory multiprocessor

1998 ◽  
pp. 167-171 ◽  
Author(s):  
Consolación Gil ◽  
Julio Ortega ◽  
Jose Luis Bernier ◽  
Maria Dolores Gil
Keyword(s):  
Shared Memory ◽  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Circuit Partitioning ◽  
Parallel Test ◽  
Shared Memory Multiprocessor

scholarly journals P4-TPG: Accelerating Deterministic Parallel Test Pattern Generation by Preemptive, Proactive, and Preventive Schedulings

IEEE Access ◽  
2019 ◽  
Vol 7 ◽  
pp. 6816-6830
Author(s):  
Louis Y.-Z. Lin ◽  
Charles Chia-Hao Hsu ◽  
Charles H.-P. Wen
Keyword(s):  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Parallel Test

Test pattern generation for logic crosstalk faults in VLSI circuits

1991 ◽  
Vol 138 (2) ◽  
pp. 179 ◽  
Author(s):  
A. Rubio ◽  
J.A. Sainz ◽  
K. Kinoshita
Keyword(s):  
Test Pattern ◽  
Pattern Generation ◽  
Vlsi Circuits ◽  
Test Pattern Generation
Sign in / Sign up

Export Citation Format

Share Document