TOF-SIMS and XPS-investigations of ion implanted single crystal 1b-diamonds

2002 ◽  
Vol 374 (4) ◽  
pp. 614-618 ◽  
Author(s):  
Schlett V. ◽  
Fladung T. ◽  
Dieckhoff S. ◽  
Stock R.
2000 ◽  
Vol 14 (12) ◽  
pp. 437-446
Author(s):  
K. SUGAWARA

Electrical resistivity due to soft phonon (SPR) is proposed. To test SPR, resistivity measurements have been carried out for conductive single-crystal samples of the SrTiO 3 system; Sr 1-x La x TiO 3, SrTi 1-y Nb y O 3 and SrTiO 3 implanted with Fe, Cr or B. Experiments reveal a weak SPR for Sr 1-x La x TiO 3, but no noticeable SPR was found for SrTi 1-y Nb y O 3. Resistivity measurements on the ion-implanted specimens reveal rather profound SPR for low-dose (semiconducting) specimens but weak SPR for high-dose (metallic) specimens. These results indicate that the magnitude of SPR may be carrier-concentration dependent or crystallinity dependent. A possible profound SPR is proposed for SrTiO 3 under optical illumination and superlattices. Also proposed is a potential application of SPR to soft-phonon devices (SPD).


2011 ◽  
Vol 20 (4) ◽  
pp. 047505 ◽  
Author(s):  
Chun-Ming Liu ◽  
Hai-Quan Gu ◽  
Xia Xiang ◽  
Yan Zhang ◽  
Yong Jiang ◽  
...  

2018 ◽  
Vol 215 (22) ◽  
pp. 1800264 ◽  
Author(s):  
Audrey Valentin ◽  
Mary De Feudis ◽  
Ovidiu Brinza ◽  
André Tardieu ◽  
Ludovic William ◽  
...  

2017 ◽  
Vol 864 ◽  
pp. 012017
Author(s):  
R. Tsuruoka ◽  
A. Shinkawa ◽  
T. Nishimura ◽  
C. Tanuma ◽  
K. Kuriyama ◽  
...  

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