Impact of surfactants on electrical conduction and preferred orientation of spray-pyrolysed nanostructured SnO2 thin films for LPG and ammonia sensing

2018 ◽  
Vol 29 (15) ◽  
pp. 13087-13102
Author(s):  
K. Prasanna Kumari ◽  
Boben Thomas ◽  
S. Deepa ◽  
Skariah Benoy
Keyword(s):  
Thin Films ◽  
Electrical Conduction ◽  
Preferred Orientation ◽  
Ammonia Sensing ◽  
Sno2 Thin Films

Assessing simultaneous effect of Ar/O2 ratio and process pressure on ammonia sensing properties of reactive DC magnetron sputtered SnO2 thin films

2021 ◽  
Vol 286 ◽  
pp. 129239
Author(s):  
Rahul Prajesh ◽  
Ravindra Kumar Jha ◽  
Vikas Saini ◽  
Mohd Nahid ◽  
Vinay Goyal ◽  
...  
Keyword(s):  
Thin Films ◽  
Sensing Properties ◽  
Simultaneous Effect ◽  
Ammonia Sensing ◽  
Process Pressure ◽  
Sno2 Thin Films

scholarly journals Preferred Orientation of SnO2 Thin Films Grown from Tri-n-Butyltin Acetate by Spray Pyrolysis Technique

1994 ◽  
Vol 102 (1183) ◽  
pp. 296-298 ◽  
Author(s):  
Isao YAGI ◽  
Katsutoshi KAKIZAWA ◽  
Kenji MURAKAMI ◽  
Shoji KANEKO
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Spray Pyrolysis Technique ◽  
Preferred Orientation ◽  
Sno2 Thin Films

MOCVD and properties of in situ doped Pt-SnO2 thin films

1999 ◽  
Vol 09 (PR8) ◽  
pp. Pr8-643-Pr8-650 ◽  
Author(s):  
M. Amjoud ◽  
F. Maury
Keyword(s):  
Thin Films ◽  
Sno2 Thin Films

Structural and optical properties of Tin Oxide and Indium doped SnO2 thin films deposited by thermal evaporation technique

2016 ◽  
Vol 12 (3) ◽  
pp. 4394-4399
Author(s):  
Sura Ali Noaman ◽  
Rashid Owaid Kadhim ◽  
Saleem Azara Hussain
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Thermal Evaporation ◽  
Pure Sno2 ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Evaporation Technique ◽  
Sno2 Thin Films

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon  substrates  by  thermal evaporation technique.  X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed  that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pure  SnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.  Optical properties such as  Transmission , optical band-gap have been measured and calculated.

Heteroepitaxy of SnO2 thin films on m-plane sapphire by MOCVD

2011 ◽  
Vol 324 (1) ◽  
pp. 98-102 ◽  
Author(s):  
Zhen Zhu ◽  
Jin Ma ◽  
Lingyi Kong ◽  
Caina Luan ◽  
Qiaoqun Yu
Keyword(s):  
Thin Films ◽  
Sno2 Thin Films

Phase transformation and preferred orientation in carboxylate derived ZrO2 thin films on silicon substates

1992 ◽  
Vol 7 (11) ◽  
pp. 3065-3071 ◽  
Author(s):  
Peir-Yung Chu ◽  
Isabelle Campion ◽  
Relva C. Buchanan
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Phase Transformation ◽  
Heating Rate ◽  
Tetragonal Phase ◽  
Monoclinic Phase ◽  
Preferred Orientation ◽  
Si Substrate ◽  
Interfacial Diffusion ◽  
Deposited Films

Phase transformation and preferred orientation in ZrO2 thin films, deposited on Si(111) and Si(100) substrates, and prepared by heat treatment from carboxylate solution precursors were investigated. The deposited films were amorphous below 450 °C, transforming gradually to the tetragonal and monoclinic phases on heating. The monoclinic phase developed from the tetragonal phase displacively, and exhibited a strong (111) preferred orientation at temperature as low as 550 °C. The degree of preferred orientation and the tetragonal-to-monoclinic phase transformation were controlled by heating rate, soak temperature, and time. Interfacial diffusion into the film from the Si substrate was negligible at 700 °C and became significant only at 900 °C, but for films thicker than 0.5 μm, overall preferred orientation exceeded 90%.

Electron scattering mechanisms in fluorine-doped SnO2 thin films

2013 ◽  
Vol 114 (18) ◽  
pp. 183713 ◽  
Author(s):  
G. Rey ◽  
C. Ternon ◽  
M. Modreanu ◽  
X. Mescot ◽  
V. Consonni ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Scattering ◽  
Scattering Mechanisms ◽  
Sno2 Thin Films
Sign in / Sign up

Export Citation Format

Share Document