scholarly journals GPU Supported Simulation of Transition-Edge Sensor Arrays

2020 ◽  
Vol 200 (5-6) ◽  
pp. 277-285 ◽  
Author(s):  
M. Lorenz ◽  
C. Kirsch ◽  
P. E. Merino-Alonso ◽  
P. Peille ◽  
T. Dauser ◽  
...  

Abstract We present numerical simulations of full transition-edge sensor (TES) arrays utilizing graphical processing units (GPUs). With the support of GPUs, it is possible to perform simulations of large pixel arrays to assist detector development. Comparisons with TES small-signal and noise theory confirm the representativity of the simulated data. In order to demonstrate the capabilities of this approach, we present its implementation in , a simulator for the X-ray Integral Field Unit, a cryogenic X-ray spectrometer on board the future Athena X-ray observatory.

2016 ◽  
Author(s):  
S. J. Smith ◽  
J. S. Adams ◽  
S. R. Bandler ◽  
G. L. Betancourt-Martinez ◽  
J. A. Chervenak ◽  
...  

Author(s):  
Stephen J. Smith ◽  
Joseph S. Adams ◽  
Simon R. Bandler ◽  
James A. Chervenak ◽  
Megan E. Eckart ◽  
...  

2015 ◽  
Vol 25 (3) ◽  
pp. 1-4 ◽  
Author(s):  
Mikko R. J. Palosaari ◽  
Leif Gronberg ◽  
Kimmo M. Kinnunen ◽  
David Gunnarsson ◽  
Mika Prunnila ◽  
...  

2018 ◽  
Vol 193 (5-6) ◽  
pp. 931-939 ◽  
Author(s):  
E. Cucchetti ◽  
M. E. Eckart ◽  
P. Peille ◽  
F. S. Porter ◽  
F. Pajot ◽  
...  

2014 ◽  
Vol 176 (3-4) ◽  
pp. 597-603 ◽  
Author(s):  
S. J. Lee ◽  
S. R. Bandler ◽  
S. E. Busch ◽  
J. S. Adams ◽  
J. A. Chervenak ◽  
...  

2015 ◽  
Vol 107 (22) ◽  
pp. 223503 ◽  
Author(s):  
S. J. Lee ◽  
J. S. Adams ◽  
S. R. Bandler ◽  
J. A. Chervenak ◽  
M. E. Eckart ◽  
...  

2006 ◽  
Vol 12 (S02) ◽  
pp. 832-833
Author(s):  
T Jach ◽  
J Ullom ◽  
N Ritchie ◽  
J Beall

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006


2019 ◽  
Vol 628 ◽  
pp. A5 ◽  
Author(s):  
Didier Barret ◽  
Massimo Cappi

Context. Active galactic nuclei (AGNs) display complex X-ray spectra that exhibit a variety of emission and absorption features. These are commonly interpreted as a combination of (i) a relativistically smeared reflection component, resulting from the irradiation of an accretion disk by a compact hard X-ray source; (ii) one or several warm or ionized absorption components produced by AGN-driven outflows crossing our line of sight; and (iii) a nonrelativistic reflection component produced by more distant material. Disentangling these components via detailed model fitting could be used to constrain the black hole spin, geometry, and characteristics of the accretion flow, as well as of the outflows and surroundings of the black hole. Aims. We investigate how a high-throughput high-resolution X-ray spectrometer such as the Athena X-ray Integral Field Unit (X-IFU) can be used to this aim, using the state-of-the-art reflection model relxill in a lamp-post geometrical configuration. Methods. We simulated a representative sample of AGN spectra, including all necessary model complexities, as well as a range of model parameters going from standard to more extreme values, and considered X-ray fluxes that are representative of known AGN and quasar populations. We also present a method to estimate the systematic errors related to the uncertainties in the calibration of the X-IFU. Results. In a conservative setting, in which the reflection component is computed self consistently by the relxill model from the pre-set geometry and no iron overabundance, the mean errors on the spin and height of the irradiating source are < 0.05 and ∼0.2 Rg (in units of gravitational radius). Similarly, the absorber parameters (column density, ionization parameter, covering factor, and velocity) are measured to an accuracy typically less than ∼5% over their allowed range of variations. Extending the simulations to include blueshifted ultra-fast outflows, we show that X-IFU could measure their velocity with statistical errors < 1%, even for high-redshift objects (e.g., at redshifts ∼2.5). Conclusion. The simulations presented here demonstrate the potential of the X-IFU to understand how black holes are powered and how they shape their host galaxies. The accuracy in recovering the physical model parameters encoded in their X-ray emission is reached thanks to the unique capability of X-IFU to separate and constrain narrow and broad emission and absorption components.


Microscopy ◽  
2020 ◽  
Vol 69 (5) ◽  
pp. 298-303
Author(s):  
Keiichi Tanaka ◽  
Akira Takano ◽  
Atsushi Nagata ◽  
Satoshi Nakayama ◽  
Kaname Takahashi ◽  
...  

Abstract A scanning electron microscope transition edge sensor has been developed to analyze the minor or trace constituents contained in a bulk sample and small particles on the sample under a low accelerating voltage (typically &lt;3 keV). The low accelerating voltage enables to improve the spatial analysis resolution because the primary electron diffusion length is limited around the sample surface. The characteristic points of our transition edge sensor are 1) high-energy resolution at 7.2 eV@Al-Kα, 2) continuous operation by using a cryogen-free dilution refrigerator and 3) improvement of transmission efficiency at B-Kα by using thin X-ray film windows between the sample and detector (about 30 times better than our previous system). Our system could achieve a stabilization of the peak shift at Nd-Mα (978 eV) within 1 eV during an operation time of 27 000 s. The detection limits with B-Kα for detection times 600 and 27 000 s were 0.27 and 0.038 wt%, respectively. We investigated the peak separation ability by measuring the peak intensity ratio between the major constitute (silicon) and the minor constitute (tungsten) because the Si-Kα line differs from the W-Mα line by only 35 eV and a small W-Mα peak superimposed on the tail of the large Si-Kα peak. The peak intensity ratio (I(W-Mα)/I(Si-Kα)) was adjusted by the W particle area ratio compared with the Si substrate area. The transition edge sensor could clearly separate the Si-Kα and W-Mα lines even under a peak intensity ratio of 0.01.


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