High Count-Rate Studies of Small-Pitch Transition-Edge Sensor X-ray Microcalorimeters

2014 ◽  
Vol 176 (3-4) ◽  
pp. 597-603 ◽  
Author(s):  
S. J. Lee ◽  
S. R. Bandler ◽  
S. E. Busch ◽  
J. S. Adams ◽  
J. A. Chervenak ◽  
...  
Keyword(s):  
Count Rate ◽  
Transition Edge Sensor ◽  
High Count ◽  
High Count Rate ◽  
X Ray ◽  
Transition Edge ◽  
Small Pitch

Optimizing Transition-Edge Sensor Design for High Count-Rate Applications

2009 ◽  
Author(s):  
Stephen J. Smith ◽  
Joe S. Adams ◽  
Simon R. Bandler ◽  
Regis P. Brekosky ◽  
Ari -D. Brown ◽  
...  
Keyword(s):  
Count Rate ◽  
Transition Edge Sensor ◽  
Sensor Design ◽  
High Count ◽  
High Count Rate ◽  
Transition Edge

High count-rate study of two TES x-ray microcalorimeters with different transition temperatures

2017 ◽  
Vol 30 (10) ◽  
pp. 104005
Author(s):  
Sang-Jun Lee ◽  
Joseph S Adams ◽  
Simon R Bandler ◽  
Gabriele L Betancourt-Martinez ◽  
James A Chervenak ◽  
...  
Keyword(s):  
Count Rate ◽  
Transition Temperatures ◽  
High Count ◽  
High Count Rate ◽  
X Ray ◽  
Rate Study

Development of laboratory x-ray fluorescence holography equipment

2003 ◽  
Vol 18 (6) ◽  
pp. 1471-1473 ◽  
Author(s):  
Yukio Takahashi ◽  
Kouichi Hayashi ◽  
Kimio Wakoh ◽  
Naomi Nishiki ◽  
Eiichiro Matsubara
Keyword(s):  
Single Crystal ◽  
Count Rate ◽  
Detection System ◽  
High Count ◽  
Synchrotron Source ◽  
High Count Rate ◽  
X Ray ◽  
Graphite Monochromator ◽  
Time Required

Laboratory x-ray fluorescence holography equipment was developed. A single-bent graphite monochromator with a large curvature and a high-count-rate x-ray detection system were applied in this equipment. To evaluate the performance of this equipment, a hologram pattern of a gold single crystal was measured. It took two days, which was about one-third the time required for the previous measurements using the conventional x-ray source and several times that using the synchrotron source. The quality of the hologram pattern is as good as that obtained using the synchrotrons. Clear atomic images on (002) are reconstructed.

F-9 Progress with Silicon Drift Detectors Used for High Resolution—High Count Rate X-ray Spectroscopy

2004 ◽  
Vol 19 (2) ◽  
pp. 197-197
Author(s):  
H. Soltau ◽  
P. Lechner ◽  
G. Lutz ◽  
L. Strüder ◽  
C. Fiorini ◽  
...  
Keyword(s):  
High Resolution ◽  
Count Rate ◽  
High Count ◽  
High Count Rate ◽  
X Ray ◽  
Silicon Drift Detectors

Noise analysis of low noise, high count rate, PIN diode X-ray detectors

1996 ◽  
Vol 43 (3) ◽  
pp. 1385-1390 ◽  
Author(s):  
C.Z. Zhou ◽  
W.K. Warburton
Keyword(s):  
Count Rate ◽  
Noise Analysis ◽  
Low Noise ◽  
Pin Diode ◽  
High Count ◽  
High Count Rate ◽  
X Ray

scholarly journals High Energy Resolution X-Ray Spectrometer for High Count Rate Xrf Applications

1993 ◽  
Vol 37 ◽  
pp. 405-411
Author(s):  
C. S. Rossington ◽  
N. W. Madden ◽  
K. Chapman
Keyword(s):  
Energy Resolution ◽  
Count Rate ◽  
High Energy ◽  
Low Noise ◽  
High Energy Resolution ◽  
Photon Flux ◽  
Large Area ◽  
High Count ◽  
High Count Rate ◽  
X Ray

AbstractA new x-ray spectrometer has been constructed which incorporates a novel large area, low capacitance Si(Li) detector and a low noise JFET (junction field effect transistor) preamplifier. The spectrometer operates at high count Tates without the conventional compromise in energy resolution. For example, at an amplifier peaking time of 1 p.sec and a throughput count rate of 145,000 counts sec-1, the energy resolution at 5.9 keV is 220 eV FWHM. Commercially available spectrometers utilizing conventional geometry Si(Li) detectors with areas equivalent to the new detector have resolutions on the order of 540 eV under the same conditions. Conventional x-ray spectrometers offering high energy resolution must employ detectors with areas one-tenth the size of the new LBL detector (20 mm2 compared with 200 mm2). However, even with the use of the smaller area detectors, the energy resolution of a commercial system is typically limited to approximately 300 eV (again, at 1 μsec and 5.9 keV) due to the noise of the commercially available JFET's. The new large area detector is useful in high count rate applications, but is also useful in the detection of weak photon signals, in which it is desirable to subtend as large an angle of the available photon flux as possible, while still maintaining excellent energy resolution. X-ray fluorescence data from die new spectrometer is shown in comparison to a commercially available system in the analysis of a dilute muhi-element material, and also in conjunction with high count rate synchrotron EXAFS applications.

scholarly journals Improving Sensitivity and Productivity with High count rate X-ray spectrum images

2017 ◽  
Vol 23 (S1) ◽  
pp. 46-47 ◽  
Author(s):  
Simon Burgess ◽  
Matthew Hiscock ◽  
Philippe Pinard
Keyword(s):  
Count Rate ◽  
High Count ◽  
High Count Rate ◽  
X Ray
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