An Optoelectronic Device for Remote Measurements of the Geometric Parameters of Sectional Objects

The article shows the relevance of the control of the geometric parameters of contact lenses. The types of lenses, their advantage over glasses, as well as devices for monitoring the radii of curvature of the concave surface of the lens are considered. The shortcomings of the available devices and methods for monitoring contact lenses are revealed. The principle and features of operation of an optoelectronic device for non-contact control of geometric parameters of contact lenses are proposed.

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Method and Device Based on Multiscan for Measuring the Geometric Parameters of Objects

Processes ◽

10.3390/pr9010024 ◽

2020 ◽

Vol 9 (1) ◽

pp. 24

Author(s):

Michael Yurievich Alies ◽

Yuriy Konstantinovich Shelkovnikov ◽

Milan Sága ◽

Milan Vaško ◽

Ivan Kuric ◽

...

Keyword(s):

High Sensitivity ◽

Optoelectronic Device ◽

Discrete Analog ◽

Video Signal ◽

Geometric Parameters ◽

Precision Measurements ◽

Dual Nature ◽

Step Voltage ◽

Accuracy Of Measurements ◽

Discrete Structures

The article deals with the issues of improving the accuracy of measurements of the geometric parameters of objects by optoelectronic systems, based on a television multiscan. A mathematical model of a multiscan with scanistor activation is developed, expressions for its integral output current and video signal are obtained, and the mechanism of their formation is investigated. An expression for the video signal is obtained that reflects the dual nature of the discrete–continuous multiscan structure: the video signal can have a discrete (pulse) or analog (continuous) form, depending on the step voltage between the photodiode cells of the multiscan. A Vernier discrete–analog method for measuring the parameters of the light zone on a multiscan is proposed, in which in order to increase the accuracy of the measurements, the location of the video pulse is determined relative to the neighboring reference pulses of a rigid geometric raster due to the slope of the discrete structure of the multiscan. It is established that the Vernier method enables one to make precision measurements of the coordinates, dimensions, and movements of the light zones by an overlay on a video raster of reference pulses from cells—a uniform sequence of Vernier pulses with a recurrence interval, followed by determining the number of the Vernier pulse that coincides with the raster pulse. An optoelectronic device based on a discrete–continuous multiscan, implemented on the basis of the proposed Vernier method of measuring the coordinates of the light zones, which has a high sensitivity to movement, is characteristic of continuous structures, and has increased stability and linearity of the coordinate characteristics typical for discrete structures, is developed.

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TEM and cathodoluminescence of precipitates in II-VI semiconductors

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100104509 ◽

1988 ◽

Vol 46 ◽

pp. 488-489

Author(s):

Joanna L. Batstone

Keyword(s):

Crystal Growth ◽

Band Gap ◽

Local Strain ◽

Wide Band ◽

Optoelectronic Device ◽

Wide Band Gap ◽

Bulk Crystal Growth ◽

Transmission Electron ◽

Device Applications ◽

Stoichiometry Control

Interest in II-VI semiconductors centres around optoelectronic device applications. The wide band gap II-VI semiconductors such as ZnS, ZnSe and ZnTe have been used in lasers and electroluminescent displays yielding room temperature blue luminescence. The narrow gap II-VI semiconductors such as CdTe and HgxCd1-x Te are currently used for infrared detectors, where the band gap can be varied continuously by changing the alloy composition x.Two major sources of precipitation can be identified in II-VI materials; (i) dopant introduction leading to local variations in concentration and subsequent precipitation and (ii) Te precipitation in ZnTe, CdTe and HgCdTe due to native point defects which arise from problems associated with stoichiometry control during crystal growth. Precipitation is observed in both bulk crystal growth and epitaxial growth and is frequently associated with segregation and precipitation at dislocations and grain boundaries. Precipitation has been observed using transmission electron microscopy (TEM) which is sensitive to local strain fields around inclusions.

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Lectin-Induced RBC Agglutination: Chemical vs. Cryofixation

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600002920 ◽

1980 ◽

Vol 38 ◽

pp. 664-665

Author(s):

Dean A. Handley ◽

Lanping A. Sung ◽

Shu Chien

Keyword(s):

Lectin Binding ◽

Freeze Substitution ◽

Electrostatic Charge ◽

Geometric Parameters ◽

Comparative Approach ◽

Chemical Fixation ◽

Cell Surfaces ◽

Minimal Cell ◽

Membrane Stiffness ◽

Cell Contour

RBC agglutination by lectins represents an interactive balance between the attractive (bridging) force due to lectin binding on cell surfaces and disaggregating forces, such as membrane stiffness and electrostatic charge repulsion (1). During agglutination, critical geometric parameters of cell contour and intercellular distance reflect the magnitude of these interactive forces and the size of the bridging macromolecule (2). Valid ultrastructural measurements of these geometric parameters from agglutinated RBC's require preservation with minimal cell distortion. As chemical fixation may adversely influence RBC geometric properties (3), we used chemical fixation and cryofixation (rapid freezing followed by freeze-substitution) as a comparative approach to examine these parameters from RBC agglutinated with Ulex I lectin.

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Evaluation of the accuracy of reconstruction of the electrophysical and geometric parameters of multilayer dielectric coatings by the multi-frequency radio wave method of a slow surface electromagnetic waves

Izmeritel`naya Tekhnika ◽

10.32446/0368-1025it.2020-8-51-58 ◽

2020 ◽

pp. 51-58

Author(s):

Aleksandr I. Kazmin ◽

Pavel A. Fedjunin

Keyword(s):

Radio Wave ◽

Noise Level ◽

Electromagnetic Waves ◽

Dielectric Materials ◽

Geometric Parameters ◽

Experimental Investigations ◽

Wave Method ◽

Dielectric Coatings ◽

Surface Electromagnetic Waves ◽

Multilayer Dielectric

One of the most important diagnostic problems multilayer dielectric materials and coatings is the development of methods for quantitative interpretation of the checkout results their electrophysical and geometric parameters. The results of a study of the potential informativeness of the multi-frequency radio wave method of surface electromagnetic waves during reconstruction of the electrophysical and geometric parameters of multilayer dielectric coatings are presented. The simulation model is presented that makes it possible to evaluate of the accuracy of reconstruction of the electrophysical and geometric parameters of multilayer dielectric coatings. The model takes into account the values of the electrophysical and geometric parameters of the coating, the noise level in the measurement data and the measurement bandwidth. The results of simulation and experimental investigations of reconstruction of the structure of relative permittivitties and thicknesses of single-layer and double-layer dielectric coatings with different thicknesses, with different values of the standard deviation (RMS) of the noise level in the measured attenuation coefficients of the surface slow electromagnetic wave are presented. Coatings based on the following materials were investigated: polymethyl methacrylate, F-4D PTFE, RO3010. The accuracy of reconstruction of the electrophysical parameters of the layers decreases with an increase in the number of evaluated parameters and an increase in the noise level. The accuracy of the estimates of the electrophysical parameters of the layers also decreases with a decrease in their relative permittivity and thickness. The results of experimental studies confirm the adequacy of the developed simulation model. The presented model allows for a specific measuring complex that implements the multi-frequency radio wave method of surface electromagnetic waves, to quantify the potential possibilities for the accuracy of reconstruction of the electrophysical and geometric parameters of multilayer dielectric materials and coatings. Experimental investigations and simulation results of a multilayer dielectric coating demonstrated the theoretical capabilities gained relative error permittivity and thickness of the individual layers with relative error not greater than 10 %, with a measurement bandwidth of 1 GHz and RMS of noise level 0,003–0,004.

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