Wide-Aperture, Low-Energy Electron Accelerators Based on High-Voltage Glow Discharge

2021 ◽  
Author(s):  
S. L. Kosogorov ◽  
N. A. Uspenskii ◽  
V. Ya. Shvedyuk ◽  
A. A. Vaselenok ◽  
I. D. Dzhigailo ◽  
...  
Keyword(s):  
Glow Discharge ◽  
High Voltage ◽  
Low Energy ◽  
Energy Electron ◽  
Wide Aperture ◽  
Electron Accelerators ◽  
Low Energy Electron

Comparison of Large-Area Low-Energy Electron Accelerators Based on a High-Voltage Glow Discharge with Accelerators Based on Longitudinal Filaments

2020 ◽  
Vol 63 (2) ◽  
pp. 227-233
Author(s):  
G. A. Baranov ◽  
V. A. Gurashvili ◽  
I. D. Djigailo ◽  
O. V. Komarov ◽  
S. L. Kosogorov ◽  
...  
Keyword(s):  
Glow Discharge ◽  
High Voltage ◽  
Low Energy ◽  
Energy Electron ◽  
Large Area ◽  
Electron Accelerators ◽  
Low Energy Electron

Modification of Cu-PE-PTFE composite coatings on rubber surface by low-energy electron beam dispersion with glow discharge

2017 ◽  
Vol 58 (1) ◽  
pp. 103-111 ◽  
Author(s):  
Bing Zhou ◽  
Zhubo Liu ◽  
Bin Xu ◽  
A.V. Rogachev ◽  
M.A. Yarmolenko ◽  
...  
Keyword(s):  
Electron Beam ◽  
Glow Discharge ◽  
Composite Coatings ◽  
Low Energy ◽  
Energy Electron ◽  
Ptfe Composite ◽  
Rubber Surface ◽  
Low Energy Electron

scholarly journals The possibility of using low-energy (below 300 keV) electron accelerators in the agro-industrial complex (a review)

2021 ◽  
Vol 30 (3) ◽  
pp. 80-92
Author(s):  
V.A. Kharlamov ◽  
◽  
O.V. Tkhorik ◽  
M.G. Pomyasova ◽  
◽  
...  
Keyword(s):  
Agricultural Sector ◽  
Electron Beams ◽  
Low Energy ◽  
Energy Electron ◽  
Industrial Complex ◽  
Important Place ◽  
Radiation Chemical ◽  
Electron Accelerators ◽  
Agricultural Produce ◽  
Low Energy Electron

An important place in the system of measures to ensure the phytosanitary safety of agricultural produce is traditionally given to chemicals. However, due to negative effects of the chemicals on the environment, new more effective and safe technologies were needed. Feasibility of the use of radiation technologies to improve food safety and agricultural quality has been studied for more than 75 years. Recently radiation-based technologies have become increasingly important in agricultural produce processing to preserve food spoilage during storage. Currently the use of electron beams with energy below 300 keV generated by electron accelerators is increasingly grown in agriculture. The key feature of electron beams is their ability to produce disinfectant ef-fect on irradiated object due to low electrons permeability. It prevents the characteristic radiation-chemical reactions and damage to the structure in the internal volume of the biological specie Such objects are seeds of agricultural plants susceptible to infectious diseases caused by phyto-pathogens. The study aims at the evaluation of the possibility to use low-energy (below 300 keV) electron accelerators in the agro-industrial complex. The paper describes the device and the principle of operation of the state-of-the-art low-energy electron accelerators, as well as their ap-plication in the agricultural sector. The paper considers the effects of low-energy electron irradia-tion of agricultural products on seed phytopathogens and pests. From the analysis of feasibility of use of the low-energy electron accelerators for radiation-induced disinfection and disinsection it becomes evident that irradiation of the crop with low-energy electrons is effective approach to minimize adverse effects of phytopathogens and to prevent destruction of irradiated biological objects. Electron-beam irradiation minimally effects on the nutritional quality of food products.

Performance Evaluation of a Novel Type of Low-Energy Electron Microscope

1990 ◽  
Vol 48 (1) ◽  
pp. 354-355
Author(s):  
Bertholdand Senftinger ◽  
Helmut Liebl
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Field Strength ◽  
Numerical Aperture ◽  
Low Energy ◽  
Energy Electron ◽  
High Resolution Imaging ◽  
Lens System ◽  
Resolution Imaging ◽  
Low Energy Electron

During the last few years the investigation of clean and adsorbate-covered solid surfaces as well as thin-film growth and molecular dynamics have given rise to a constant demand for high-resolution imaging microscopy with reflected and diffracted low energy electrons as well as photo-electrons. A recent successful implementation of a UHV low-energy electron microscope by Bauer and Telieps encouraged us to construct such a low energy electron microscope (LEEM) for high-resolution imaging incorporating several novel design features, which is described more detailed elsewhere.The constraint of high field strength at the surface required to keep the aberrations caused by the accelerating field small and high UV photon intensity to get an improved signal-to-noise ratio for photoemission led to the design of a tetrode emission lens system capable of also focusing the UV light at the surface through an integrated Schwarzschild-type objective. Fig. 1 shows an axial section of the emission lens in the LEEM with sample (28) and part of the sample holder (29). The integrated mirror objective (50a, 50b) is used for visual in situ microscopic observation of the sample as well as for UV illumination. The electron optical components and the sample with accelerating field followed by an einzel lens form a tetrode system. In order to keep the field strength high, the sample is separated from the first element of the einzel lens by only 1.6 mm. With a numerical aperture of 0.5 for the Schwarzschild objective the orifice in the first element of the einzel lens has to be about 3.0 mm in diameter. Considering the much smaller distance to the sample one can expect intense distortions of the accelerating field in front of the sample. Because the achievable lateral resolution depends mainly on the quality of the first imaging step, careful investigation of the aberrations caused by the emission lens system had to be done in order to avoid sacrificing high lateral resolution for larger numerical aperture.

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