Three-Dimensional Atom Probe Characterization of Nanoclusters Responsible for Multistep Aging Behavior of an Al-Mg-Si Alloy

The formation of nano-scale clusters (nanoclusters) prior to the precipitation of the strengthening b” phase significantly influences two-step aging behavior of Al-Mg-Si alloys. In this work, the existence of two kinds of nanoclusters has been verified in the early stage of phase decomposition by differential scanning calorimetry (DSC) and three-dimensional atom probe (3DAP). Pre-aging treatment at 373K before natural aging was also found to form preferentially one of the two nanoclusters, resulting in the remarkable restoration of age-hardenability at paint-bake temperatures. Such microstructural control by means of optimized heat-treatments; i.e. nanocluster assist processing (NCAP), possesses great potential for enabling Al-Mg-Si alloys to be used more widely as a body-sheet material of automobiles.

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On the Role of Characterization in the Design of Interfaces in Nanoscale Materials Technology

Microscopy and Microanalysis ◽

10.1017/s1431927604040504 ◽

2004 ◽

Vol 10 (3) ◽

pp. 324-335 ◽

Cited By ~ 11

Author(s):

S.P. Ringer ◽

K.R. Ratinac

Keyword(s):

Three Dimensional ◽

Atom Probe ◽

Turbine Rotor ◽

Clay Nanocomposites ◽

Multimodal Approach ◽

Transmission Electron ◽

Different Types ◽

And Control

This work reviews recent research on the design and control of interfaces in engineering nanomaterials. Four case studies are presented that demonstrate the power of a multimodal approach to the characterization of different types of interfaces. We have used a combination of conventional, high resolution, and analytical transmission electron microscopy, microbeam electron diffraction, and three-dimensional atom probe to study polymer–clay nanocomposites, turbine rotor steels used for power generation, multicomponent aluminum alloys, and nanocrystalline magnetic materials.

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Three dimensional characterization of dopant distribution in polycrystalline silicon by laser-assisted atom probe

Applied Physics Letters ◽

10.1063/1.2995864 ◽

2008 ◽

Vol 93 (13) ◽

pp. 133507 ◽

Cited By ~ 18

Author(s):

K. Inoue ◽

F. Yano ◽

A. Nishida ◽

T. Tsunomura ◽

T. Toyama ◽

...

Keyword(s):

Polycrystalline Silicon ◽

Three Dimensional ◽

Atom Probe ◽

Dopant Distribution

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Atom Scale Characterization of the Near Apex Region of an Atomic Force Microscope Tip

Microscopy and Microanalysis ◽

10.1017/s1431927610000437 ◽

2010 ◽

Vol 16 (5) ◽

pp. 636-642 ◽

Cited By ~ 2

Author(s):

Christopher J. Tourek ◽

Sriram Sundararajan

Keyword(s):

Thin Film ◽

Atomic Force Microscope ◽

Three Dimensional ◽

Atom Probe ◽

Material Structure ◽

Atomic Force ◽

Transmission Electron ◽

Afm Tips ◽

Scale Characterization

AbstractThree-dimensional atom probe tomography (APT) is successfully used to analyze the near-apex regions of an atomic force microscope (AFM) tip. Atom scale material structure and chemistry from APT analysis for standard silicon AFM tips and silicon AFM tips coated with a thin film of Cu is presented. Comparison of the thin film data with that observed using transmission electron microscopy indicates that APT can be reliably used to investigate the material structure and chemistry of the apex of an AFM tip at near atomic scales.

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