Dislocation Substructure Analysis in γ′-Precipitated Ni-Based Alloy by X-Ray Diffraction Combined with Positron Annihilation

2019 ◽  
Vol 50 (7) ◽  
pp. 3201-3212
Author(s):  
Mitsuharu Yonemura ◽  
Koji Inoue
1995 ◽  
Vol 78 (3) ◽  
pp. 1510-1513 ◽  
Author(s):  
S. Fujii ◽  
Y. Nishibayashi ◽  
S. Shikata ◽  
A. Uedono ◽  
S. Tanigawa

1984 ◽  
Vol 16 (1) ◽  
pp. 15-20 ◽  
Author(s):  
Stephen Doyle ◽  
Bansi D. Malhotra ◽  
Norman Peacock ◽  
Richard A. Pethrick

2019 ◽  
Vol 6 (8) ◽  
pp. 2167-2177 ◽  
Author(s):  
K. Sudarshan ◽  
V. Tiwari ◽  
P. Utpalla ◽  
S. K. Gupta

Defects and their influence on light emitting properties were explored in CeO2:Eu,Nb using Rietveld refinement, positron annihilation and luminescence spectroscopy.


2019 ◽  
Vol 5 (1) ◽  
pp. 6 ◽  
Author(s):  
Guido Panzarasa ◽  
Giovanni Consolati ◽  
Marco Scavini ◽  
Mariangela Longhi ◽  
Fiorenza Quasso

Graphene oxide (GO) is conveniently prepared from expandable graphite using a simplified Hummers’ method. The product is thoroughly characterized by usual techniques (UV-vis, Fourier-transform infrared (FTIR) and Raman spectroscopies, zeta potential, electron microscopy, X-ray diffraction, nitrogen adsorption) to confirm the success of synthesis. Positron annihilation lifetime spectroscopy (PALS) is then used to extract information on the microenvironment in between the layers of graphene oxide.


1995 ◽  
Vol 61 (3) ◽  
pp. 331-333 ◽  
Author(s):  
S. Fujii ◽  
Y. Nishibayashi ◽  
S. Shikata ◽  
A. Uedono ◽  
S. Tanigawa

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