Epitaxial SiC Growth Morphology and Extended Defects Investigated by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging

2007 ◽  
Vol 37 (5) ◽  
pp. 691-698 ◽  
Author(s):  
Yoosuf N. Picard ◽  
Mark E. Twigg ◽  
Joshua D. Caldwell ◽  
Charles R. Eddy ◽  
Philip G. Neudeck ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Extended Defects ◽  
Growth Morphology ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Study of Dislocation Substructures in High-Mn Steels by Electron Channeling Contrast Imaging

2014 ◽  
Vol 783-786 ◽  
pp. 750-754
Author(s):  
Iván Gutierrez-Urrutia ◽  
Dierk Raabe
Keyword(s):  
Crystallographic Orientation ◽  
Strain Path ◽  
Electron Backscatter Diffraction ◽  
Dislocation Substructure ◽  
Orientation Dependence ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Fast Approach ◽  
Electron Backscatter ◽  
Backscatter Diffraction

We have investigated the formation of dislocation substructures in high-Mn steels by electron channeling contrast imaging in the SEM. The coupling of electron channeling contrast imaging (ECCI) with electron backscatter diffraction (EBSD) provides an efficient and fast approach to characterize dislocation substructures under controlled diffraction conditions with enhanced contrast. The dislocation substructure of high-Mn steels at intermediate strain levels is characterized by cells and cell blocks with strong crystallographic orientation dependence. We observe a significant effect of strain path on dislocation patterning. Microband formation is enabled under shearing conditions. We explain this effect on terms of Schmid’s law.

Characterization of Amorphous Oxide Nano-Thick Layers on 316L Stainless Steel by Electron Channeling Contrast Imaging and Electron Backscatter Diffraction

2016 ◽  
Vol 22 (5) ◽  
pp. 997-1006 ◽  
Author(s):  
Mahrokh Dorri ◽  
Stéphane Turgeon ◽  
Nicolas Brodusch ◽  
Maxime Cloutier ◽  
Pascale Chevallier ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Oxide Layer ◽  
316L Stainless Steel ◽  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Amorphous Oxide ◽  
Electron Channeling ◽  
Electron Backscatter ◽  
Backscatter Diffraction

AbstractCharacterization of the topmost surface of biomaterials is crucial to understanding their properties and interactions with the local environment. In this study, the oxide layer microstructure of plasma-modified 316L stainless steel (SS316L) samples was analyzed by a combination of electron backscatter diffraction and electron channeling contrast imaging using low-energy incident electrons. Both techniques allowed clear identification of a nano-thick amorphous oxide layer, on top of the polycrystalline substrate, for the plasma-modified samples. A methodology was developed using Monte Carlo simulations combined with the experimental results to estimate thickness of the amorphous layer for different surface conditions. X-ray photoelectron spectroscopy depth profiles were used to validate these estimations.

Characterization of Nitride Thin Films by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging

2005 ◽  
Vol 892 ◽  
Author(s):  
Carol Trager-Cowan ◽  
Francis Sweeney ◽  
A J Wilkinson ◽  
P W Trimby ◽  
A. P. Day ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Electron Backscatter ◽  
Backscatter Diffraction

The application of electron backscatter diffraction and orientation contrast imaging in the SEM to textural problems in rocks

1999 ◽  
Vol 84 (11-12) ◽  
pp. 1741-1759 ◽  
Author(s):  
David J. Prior ◽  
Alan P. Boyle ◽  
Frank Brenker ◽  
Michael C. Cheadle ◽  
Austin Day ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Orientation Contrast ◽  
Electron Backscatter ◽  
Backscatter Diffraction

scholarly journals Novel −75°C SEM cooling stage: application for martensitic transformation in steel

Microscopy ◽  
2020 ◽  
Author(s):  
Kaneaki Tsuzazki ◽  
Motomichi Koyama ◽  
Ryosuke Sasaki ◽  
Keiichiro Nakafuji ◽  
Kazushi Oie ◽  
...  
Keyword(s):  
Martensitic Transformation ◽  
Electron Backscatter Diffraction ◽  
Dislocation Slip ◽  
In Situ Observation ◽  
Contrast Imaging ◽  
Cooling Stage ◽  
Electron Channelling ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Abstract Microstructural changes during the martensitic transformation from face-centred cubic (FCC) to body-centred cubic (BCC) in an Fe-31Ni alloy were observed by scanning electron microscopy (SEM) with a newly developed Peltier stage available at temperatures to  −75°C. Electron channelling contrast imaging (ECCI) was utilized for the in situ observation during cooling. Electron backscatter diffraction analysis at ambient temperature (20°C) after the transformation was performed for the crystallographic characterization. A uniform dislocation slip in the FCC matrix associated with the transformation was detected at −57°C. Gradual growth of a BCC martensite was recognized upon cooling from −57°C to −63°C.

Sign in / Sign up

Export Citation Format

Share Document