Characterization of Nitride Thin Films by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging
2016 ◽
Vol 22
(5)
◽
pp. 997-1006
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2007 ◽
Vol 37
(5)
◽
pp. 691-698
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2016 ◽
Vol 22
(S3)
◽
pp. 1792-1793
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2006 ◽
Vol 22
(11)
◽
pp. 1352-1358
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2016 ◽
Vol 296
◽
pp. 13-19
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2014 ◽
Vol 783-786
◽
pp. 750-754
2002 ◽
Vol 205
(3)
◽
pp. 226-230
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