The application of electron backscatter diffraction and orientation contrast imaging in the SEM to textural problems in rocks

1999 ◽  
Vol 84 (11-12) ◽  
pp. 1741-1759 ◽  
Author(s):  
David J. Prior ◽  
Alan P. Boyle ◽  
Frank Brenker ◽  
Michael C. Cheadle ◽  
Austin Day ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Orientation Contrast ◽  
Electron Backscatter ◽  
Backscatter Diffraction

scholarly journals Novel −75°C SEM cooling stage: application for martensitic transformation in steel

Microscopy ◽  
2020 ◽  
Author(s):  
Kaneaki Tsuzazki ◽  
Motomichi Koyama ◽  
Ryosuke Sasaki ◽  
Keiichiro Nakafuji ◽  
Kazushi Oie ◽  
...  
Keyword(s):  
Martensitic Transformation ◽  
Electron Backscatter Diffraction ◽  
Dislocation Slip ◽  
In Situ Observation ◽  
Contrast Imaging ◽  
Cooling Stage ◽  
Electron Channelling ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Abstract Microstructural changes during the martensitic transformation from face-centred cubic (FCC) to body-centred cubic (BCC) in an Fe-31Ni alloy were observed by scanning electron microscopy (SEM) with a newly developed Peltier stage available at temperatures to  −75°C. Electron channelling contrast imaging (ECCI) was utilized for the in situ observation during cooling. Electron backscatter diffraction analysis at ambient temperature (20°C) after the transformation was performed for the crystallographic characterization. A uniform dislocation slip in the FCC matrix associated with the transformation was detected at −57°C. Gradual growth of a BCC martensite was recognized upon cooling from −57°C to −63°C.

Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)

2012 ◽  
Vol 18 (S2) ◽  
pp. 702-703 ◽  
Author(s):  
J.R. Seal ◽  
T. Bieler ◽  
M. Crimp ◽  
B. Britton ◽  
A. Wilkinson
Keyword(s):  
High Resolution ◽  
Electron Backscatter Diffraction ◽  
Pure Titanium ◽  
Commercially Pure Titanium ◽  
Contrast Imaging ◽  
Commercially Pure ◽  
Slip Transfer ◽  
Resolution Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging

2006 ◽  
Vol 22 (11) ◽  
pp. 1352-1358 ◽  
Author(s):  
C. Trager-Cowan ◽  
F. Sweeney ◽  
A. Winkelmann ◽  
A. J. Wilkinson ◽  
P. W. Trimby ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Electron Channelling ◽  
Electron Backscatter ◽  
Backscatter Diffraction
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