Influence of Bias Voltage and CH4/N2 Gas Ratio on the Structure and Mechanical Properties of TiCN Coatings Deposited by Cathodic Arc Deposition Method

2018 ◽  
Vol 28 (1) ◽  
pp. 343-354 ◽  
Author(s):  
Nikolay Petkov ◽  
Egor Kashkarov ◽  
Aleksei Obrosov ◽  
Totka Bakalova ◽  
Pavel Kejzlar ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Bias Voltage ◽  
Deposition Method ◽  
Cathodic Arc Deposition ◽  
Cathodic Arc ◽  
Arc Deposition ◽  
Gas Ratio

Photocatalytic Bactericidal Effect of TiO2 Thin Films Produced by Cathodic Arc Deposition Method

2003 ◽  
Vol 254-256 ◽  
pp. 463-466 ◽  
Author(s):  
B. Kepenek ◽  
U.Ö.Ş. Seker ◽  
A.F. Çakır ◽  
M. Ürgen ◽  
C. Tamerler
Keyword(s):  
Thin Films ◽  
Bactericidal Effect ◽  
Deposition Method ◽  
Cathodic Arc Deposition ◽  
Cathodic Arc ◽  
Arc Deposition

Structural and mechanical properties of Cr–Al–O–N thin films grown by cathodic arc deposition

2012 ◽  
Vol 60 (19) ◽  
pp. 6494-6507 ◽  
Author(s):  
A. Khatibi ◽  
J. Sjölen ◽  
G. Greczynski ◽  
J. Jensen ◽  
P. Eklund ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Cathodic Arc Deposition ◽  
Cathodic Arc ◽  
Arc Deposition

Measurement of Mechanical Properties of Single and Multilayered Nitride thin Films Prepared by Cathodic Arc Deposition

2001 ◽  
Vol 697 ◽  
Author(s):  
A.K. Sikder ◽  
I. M. Irfan ◽  
Ashok Kumar ◽  
Robert Durvin ◽  
Mark McDonough ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
X Ray Diffraction ◽  
Thin Coatings ◽  
Force Microscopy ◽  
Atomic Force ◽  
Cathodic Arc Deposition ◽  
Steel Substrates ◽  
Cathodic Arc ◽  
Arc Deposition

Mechanical properties of thin films differ significantly from those of bulk materials due to the effects of interfaces, microstructure and thick underlying substrates. In this study we will present the results of nanoindentation tests to evaluate mechanical properties of nitride (TiN, ZrN, CrN, TiCN and TiAlN) thin films. Films were coated on steel substrates using cathodic arc deposition technique. Surface morphology and roughness of the samples are investigated using atomic force microscopy (AFM). Films were also characterized by x-ray diffraction (XRD) technique. Nanoindentation technique along with AFM and XRD methods are very useful for characterizing hard thin coatings.

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