Effect of Tensile Deformation on Microstructure and Material Properties of Hyper-Duplex Stainless Steel

Author(s):  
Nandhu M. Nair ◽  
P. Nithin Raj ◽  
Jinu Paul
2014 ◽  
Vol 100 (10) ◽  
pp. 1261-1266 ◽  
Author(s):  
Masatoshi Aramaki ◽  
Satoshi Uchida ◽  
Kyono Yasuda ◽  
Makoto Oikawa ◽  
Osamu Furukimi

2006 ◽  
pp. 99-114

Abstract Duplex stainless steels are two-phase alloys based on the iron-chromium-nickel system. Duplex stainless steels offer corrosion resistance and cost advantages over the common austenitic stainless steels. Although there are some problems with welding duplex alloys, considerable progress has been made in defining the correct parameters and chemistry modifications for achieving sound welds. This chapter provides a basic understanding of the development, grade designations, microstructure, properties, and general welding considerations of duplex stainless steel. It also discusses the influence of ferrite-austenite balance on corrosion resistance and the influence of different welding conditions on various material properties of alloy 2205 (UNS S31803).


Author(s):  
A. Redjaïmia ◽  
J.P. Morniroli ◽  
G. Metauer ◽  
M. Gantois

2D and especially 3D symmetry information required to determine the crystal structure of four intermetallic phases present as small particles (average size in the range 100-500nm) in a Fe.22Cr.5Ni.3Mo.0.03C duplex stainless steel is not present in most Convergent Beam Electron Diffraction (CBED) patterns. Nevertheless it is possible to deduce many crystal features and to identify unambiguously these four phases by means of microdiffraction patterns obtained with a nearly parallel beam focused on a very small area (50-100nm).From examinations of the whole pattern reduced (RS) and full (FS) symmetries the 7 crystal systems and the 11 Laue classes are distinguished without ambiguity (1). By considering the shifts and the periodicity differences between the ZOLZ and FOLZ reflection nets on specific Zone Axis Patterns (ZAP) which depend on the crystal system, the centering type of the cell and the glide planes are simultaneously identified (2). This identification is easily done by comparisons with the corresponding simulated diffraction patterns.


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