The scattering of low energy electrons by electric field fluctuations near crystal surfaces

1975 ◽  
Vol 48 (1) ◽  
pp. 59-79 ◽  
Author(s):  
D.L. Mills
Keyword(s):  
Electric Field ◽  
Low Energy ◽  
Crystal Surfaces ◽  
Low Energy Electrons ◽  
Field Fluctuations

Diffraction of low-energy electrons at crystal surfaces

1966 ◽  
Vol 4 (2) ◽  
pp. 150-160 ◽  
Author(s):  
K. Hirabayashi ◽  
Y. Takeishi
Keyword(s):  
Low Energy ◽  
Crystal Surfaces ◽  
Low Energy Electrons

scholarly journals Relationship between low-frequency electric-field fluctuations and ion conics around the cusp/cleft region

2006 ◽  
Vol 24 (2) ◽  
pp. 667-677
Author(s):  
W. Miyake ◽  
A. Matsuoka ◽  
T. Mukai
Keyword(s):  
Electric Field ◽  
Low Frequency ◽  
Low Energy ◽  
Integration Time ◽  
Field Fluctuations ◽  
The Difference ◽  
Field Lines ◽  
Local Intensity ◽  
The Relationship ◽  
Ion Conics

Abstract. We investigated the relationship between low-frequency (0.2-4.0 Hz) electric-field fluctuations (LEFs) and ion conics around the dayside cusp/cleft region in the altitude range from 5000 to 10000km from observations made by the Akebono satellite. Ion conics were generally associated with intense LEFs. We found a significant correlation between the power spectral density of LEFs at any frequency and the energy of simultaneously observed ion conics. Ion conics with a conic angle near 90 deg and those more aligned with magnetic field lines both had an equivalent correlation with the local intensity of the LEFs. The LEFs associated with near-perpendicular ion conics were, however, generally more intense than those associated with folded conics. The difference was clearer for low-energy conics. These results are in agreement with a scenario of height-integrated heating of ions and energization of ions by electromagnetic energy supplied by local LEFs. Ions generally stay in the energization region during their upward motion along the field line, so that more folded ion conics with weak energization reach the same energy level as near-perpendicular conics with strong energization, due to the difference in integration time. The limit on residence time in the intense heating region causes the clearer difference for low-energy conics. We set up a simple model to examine the relationship between the energization rate and the evolution of ion conics along the field lines, and obtained good agreement with the observation results.

scholarly journals Исследование электронной прозрачности графена для малых энергий электрона

2018 ◽  
Vol 44 (18) ◽  
pp. 94
Author(s):  
Э.А. Ильичев ◽  
А.Е. Кулешов ◽  
Д.М. Мигунов ◽  
Р.М. Набиев ◽  
Г.Н. Петрухин ◽  
...  
Keyword(s):  
Electric Field ◽  
Ultraviolet Radiation ◽  
Vacuum Ultraviolet ◽  
Low Energy ◽  
Vacuum Ultraviolet Radiation ◽  
Nanoelectronic Devices ◽  
Low Energy Electrons ◽  
Graphene Membranes

AbstractThe transparency of graphene membranes for electrons with energies in the range from 5 to 50 eV has been studied with a view to using graphene as an electrode stimulating field-induced emission in microand nanoelectronic devices. The behavior of electrons reflected from a membrane was analyzed with allowance for their return under the action of a retarding electric field. Low-energy electrons were represented by photoelectrons emitted from a diamond photocathode under the action of vacuum ultraviolet radiation.

Transfer optics for high spatial resolution electron spectroscopy

1988 ◽  
Vol 46 ◽  
pp. 666-667
Author(s):  
G. G. Hembree ◽  
Luo Chuan Hong ◽  
P.A. Bennett ◽  
J.A. Venables
Keyword(s):  
Magnetic Field ◽  
Scanning Transmission Electron Microscope ◽  
Low Energy ◽  
Objective Lens ◽  
State University ◽  
Arizona State University ◽  
Initial Field ◽  
Resolution Electron ◽  
Scanning Transmission ◽  
Low Energy Electrons

A new field emission scanning transmission electron microscope has been constructed for the NSF HREM facility at Arizona State University. The microscope is to be used for studies of surfaces, and incorporates several surface-related features, including provision for analysis of secondary and Auger electrons; these electrons are collected through the objective lens from either side of the sample, using the parallelizing action of the magnetic field. This collimates all the low energy electrons, which spiral in the high magnetic field. Given an initial field Bi∼1T, and a final (parallelizing) field Bf∼0.01T, all electrons emerge into a cone of semi-angle θf≤6°. The main practical problem in the way of using this well collimated beam of low energy (0-2keV) electrons is that it is travelling along the path of the (100keV) probing electron beam. To collect and analyze them, they must be deflected off the beam path with minimal effect on the probe position.

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