Core and valence electron excitations of amorphous silicon oxide and silicon nitride studied by low energy electron loss spectroscopy
Keyword(s):
Keyword(s):
1981 ◽
Vol 50
(1)
◽
pp. 106-113
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Keyword(s):
Keyword(s):
1988 ◽
Vol 33-34
◽
pp. 180-186
◽
1987 ◽
Vol 147
(2)
◽
pp. 137-147
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