Surface and interface stress effects in thin films

In this manuscript, we discuss the influence of surface and interface stress on the elastic field of a nanoparticle, embedded in a finite spherical substrate. We consider an axially symmetric traction field acting along the outer boundary of the substrate and a non-shear uniform eigenstrain field inside the particle. As a result of axial symmetry, two Papkovitch-Neuber displacement potential functions are sufficient to represent the elastic solution. The surface and interface stress effects are fully represented utilizing Gurtin and Murdoch's theory of surface and interface elasticity. These effects modify the traction-continuity boundary conditions associated with the classical continuum elasticity theory. A complete methodology is presented resulting in the solution of the elastostatic Navier's equations. In contrast to the classical solution, the modified version introduces additional dependencies on the size of the nanoparticles as well as the surface and interface material properties.

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Surface and interface stress effects on interfacial and nanostructured materials

Materials Science and Engineering A ◽

10.1016/s0921-5093(97)00128-7 ◽

1997 ◽

Vol 237 (2) ◽

pp. 180-184 ◽

Cited By ~ 96

Author(s):

R.C. Cammarata

Keyword(s):

Nanostructured Materials ◽

Interface Stress ◽

Surface And Interface ◽

Stress Effects

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Surface and interface stress effects on the interaction of nano-inclusions and nano-cracks in an infinite domain under anti-plane shear

International Journal of Mechanical Sciences ◽

10.1016/j.ijmecsci.2016.03.018 ◽

2016 ◽

Vol 111-112 ◽

pp. 12-23 ◽

Cited By ~ 7

Author(s):

J.Y. Xu ◽

C.Y. Dong

Keyword(s):

Interface Stress ◽

Infinite Domain ◽

Plane Shear ◽

Surface And Interface ◽

Stress Effects

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X-ray diffraction and Raman investigations of thickness dependent stress effects on Pb(ZrxTi1−x)O3 thin films

Applied Physics Letters ◽

10.1063/1.2216895 ◽

2006 ◽

Vol 88 (25) ◽

pp. 252901 ◽

Cited By ~ 10

Author(s):

Jyrki Lappalainen ◽

Vilho Lantto ◽

Johannes Frantti ◽

Jussi Hiltunen

Keyword(s):

Thin Films ◽

X Ray Diffraction ◽

X Ray ◽

Stress Effects

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Theory of bulk, surface and interface phase transition kinetics in thin films

The Journal of Chemical Physics ◽

10.1063/1.1760737 ◽

2004 ◽

Vol 121 (2) ◽

pp. 1038-1049 ◽

Cited By ~ 15

Author(s):

Ellen H. G. Backus ◽

Mischa Bonn

Keyword(s):

Thin Films ◽

Phase Transition ◽

Surface And Interface ◽

Interface Phase ◽

Bulk Surface ◽

Phase Transition Kinetics

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Stress Effects in Drying Polymer Films

MRS Proceedings ◽

10.1557/proc-356-547 ◽

1994 ◽

Vol 356 ◽

Cited By ~ 7

Author(s):

S. Y. Tam ◽

L. E. Scriven ◽

H. K. Stolarski

Keyword(s):

Thin Films ◽

Mass Transfer ◽

Diffusion Coefficient ◽

Polymer Films ◽

Material Properties ◽

Film Surface ◽

Viscoplastic Material ◽

Stress Effects ◽

Diffusion And Convection ◽

Extra Stress

AbstractA model is developed to predict the magnitude and pattern of stress due to drying of polymer films. This model combines diffusion-and-convection equation with large deformation elasto-viscoplasticity, utilizing concentration dependent elastic and viscoplastic material properties to better represent the behavior of drying thin films.The results show that the highest stress occurs at film surface where the concentration depletion is the highest. The magnitude of this stress is induced by increasing mass transfer across the film surface but reduced by increasing diffusion coefficient. The edge effect is significant but local, limited to about four film thicknesses. Similarly, change in substrate induces extra stress.

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