Precise measurement of the Jπ = 1− resonance in 14N by 13C+p elastic scattering on a thick target

Author(s):  
M. Benjelloun ◽  
Th. Delbar ◽  
W. Galster ◽  
P. Leleux ◽  
E. Liénard ◽  
...  
2011 ◽  
Vol 267 ◽  
pp. 012011
Author(s):  
M G Pellegriti ◽  
D Torresi ◽  
L Cosentino ◽  
A Di Pietro ◽  
C Ducoin ◽  
...  

2018 ◽  
Vol 184 ◽  
pp. 02013
Author(s):  
H. Shimizu ◽  
D. Kahl ◽  
H. Yamaguchi ◽  
K. Abe ◽  
O. Beliuskina ◽  
...  

We performed an experiment to measure proton resonant elastic scattering of a mixed 26m,gAl beam with a thick target in inverse kinematics by using CNS RI beam sep-arator, located at RIKEN Nishina Center. It aimed to search for strong proton resonances and determine level properties of low spin-parity states in 27Si. Diagnosis of the 26mAl purity of the beam by annihilation radiation are discussed.


2016 ◽  
Vol 94 (6) ◽  
Author(s):  
G. Marquínez-Durán ◽  
I. Martel ◽  
A. M. Sánchez-Benítez ◽  
L. Acosta ◽  
R. Berjillos ◽  
...  

2010 ◽  
Vol 107 ◽  
pp. 123-128 ◽  
Author(s):  
J.A.R. Pacheco de Carvalho ◽  
C.F.F.P.R. Pacheco ◽  
A.D. Reis

This article involves computer simulation and surface analysis by nuclear techniques, which are non-destructive. The “energy method of analysis” for nuclear reactions and elastic scattering is used. Energy spectra are computer simulated and compared with experimental data, giving target composition and concentration profile information. The method is successfully applied to depth profiling of 18O and 12C nuclei in thick targets through the 18O(p,α0)15N and 12C(d,p0)13C reactions, respectively. Similarly, elastic scattering of (4He)+ ions is applied to determination of concentration profiles of O and Al for a thick target containing a thin film of aluminium oxide.


2014 ◽  
Vol 119 (4) ◽  
pp. 663-667 ◽  
Author(s):  
N. A. Mynbayev ◽  
A. K. Nurmukhanbetova ◽  
V. Z. Gol’dberg ◽  
M. S. Golovkov ◽  
G. V. Rogachev ◽  
...  

2011 ◽  
Vol 20 (04) ◽  
pp. 1026-1029 ◽  
Author(s):  
D. TORRESI ◽  
M. LATTUADA ◽  
A. MUSUMARRA ◽  
M.G. PELLEGRITI ◽  
M. ROVITUSO ◽  
...  

The 8Li elastic scattering on a 4He gas target was studied by means of the Inverse Kinematic Thick Target scattering method (TTIK) in order to investigate cluster configurations in excited states of 12 B . A 8 Li beam, at Ec.m. = 10.2 MeV , was provided by the EXCYT radioactive beam facility at Catania. The beam, while passing through the helium thick target decreases its energy, thus exploring the 8 Li -α center-of-mass energy range 2.7 MeV ≤ECM ≤9.6 MeV . Four Δ E - E silicon detector telescopes were used to detect the recoiling alpha particles. The time interval between the 8 Li passing through a micro-channel plate foil, placed at the entrance of the chamber, and the detection of the α particles by the Δ E detectors was also measured. The time measurement allows to disentangle elastic from reactions events, otherwise impossible from energy measurements. This can be considered as an improvement of the TTIK method. In this paper the used experimental technique and the obtained preliminary results will be presented.


1993 ◽  
Vol 316 (2-3) ◽  
pp. 448-454 ◽  
Author(s):  
C. Augier ◽  
D. Bernard ◽  
J. Bourotte ◽  
M. Bozzo ◽  
A. Bueno ◽  
...  

Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.


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