scholarly journals Alpha structure of12B studied by elastic scattering of8Li EXCYT beam on4He thick target

2011 ◽  
Vol 267 ◽  
pp. 012011
Author(s):  
M G Pellegriti ◽  
D Torresi ◽  
L Cosentino ◽  
A Di Pietro ◽  
C Ducoin ◽  
...  
Keyword(s):  
Elastic Scattering ◽  
Thick Target

scholarly journals Isomeric 26Al beam production with CRIB

2018 ◽  
Vol 184 ◽  
pp. 02013
Author(s):  
H. Shimizu ◽  
D. Kahl ◽  
H. Yamaguchi ◽  
K. Abe ◽  
O. Beliuskina ◽  
...  
Keyword(s):  
Elastic Scattering ◽  
Inverse Kinematics ◽  
Thick Target ◽  
Annihilation Radiation ◽  
Spin Parity ◽  
Beam Production ◽  
Proton Resonances ◽  
Ri Beam

We performed an experiment to measure proton resonant elastic scattering of a mixed 26m,gAl beam with a thick target in inverse kinematics by using CNS RI beam sep-arator, located at RIKEN Nishina Center. It aimed to search for strong proton resonances and determine level properties of low spin-parity states in 27Si. Diagnosis of the 26mAl purity of the beam by annihilation radiation are discussed.

Computer Simulation and Depth Profiling of Light Nuclei by Nuclear Techniques

2010 ◽  
Vol 107 ◽  
pp. 123-128 ◽  
Author(s):  
J.A.R. Pacheco de Carvalho ◽  
C.F.F.P.R. Pacheco ◽  
A.D. Reis
Keyword(s):  
Computer Simulation ◽  
Elastic Scattering ◽  
Nuclear Reactions ◽  
Depth Profiling ◽  
Thick Target ◽  
Light Nuclei ◽  
Target Composition ◽  
Nuclear Techniques ◽  
Non Destructive

This article involves computer simulation and surface analysis by nuclear techniques, which are non-destructive. The “energy method of analysis” for nuclear reactions and elastic scattering is used. Energy spectra are computer simulated and compared with experimental data, giving target composition and concentration profile information. The method is successfully applied to depth profiling of 18O and 12C nuclei in thick targets through the 18O(p,α0)15N and 12C(d,p0)13C reactions, respectively. Similarly, elastic scattering of (4He)+ ions is applied to determination of concentration profiles of O and Al for a thick target containing a thin film of aluminium oxide.

Study of the excitation function for the 13C + 4He elastic scattering with the thick-target inverse kinematics method

2014 ◽  
Vol 119 (4) ◽  
pp. 663-667 ◽  
Author(s):  
N. A. Mynbayev ◽  
A. K. Nurmukhanbetova ◽  
V. Z. Gol’dberg ◽  
M. S. Golovkov ◽  
G. V. Rogachev ◽  
...  
Keyword(s):  
Elastic Scattering ◽  
Excitation Function ◽  
Inverse Kinematics ◽  
Thick Target

Li-α CLUSTER STATES IN 12B USING 8Li + 4He INVERSE KINEMATICS ELASTIC SCATTERING

2011 ◽  
Vol 20 (04) ◽  
pp. 1026-1029 ◽  
Author(s):  
D. TORRESI ◽  
M. LATTUADA ◽  
A. MUSUMARRA ◽  
M.G. PELLEGRITI ◽  
M. ROVITUSO ◽  
...  
Keyword(s):  
Elastic Scattering ◽  
Center Of Mass ◽  
Silicon Detector ◽  
Inverse Kinematic ◽  
Thick Target ◽  
Alpha Particles ◽  
Radioactive Beam ◽  
Time Interval ◽  
Scattering Method ◽  
Center Of Mass Energy

The 8Li elastic scattering on a 4He gas target was studied by means of the Inverse Kinematic Thick Target scattering method (TTIK) in order to investigate cluster configurations in excited states of 12 B . A 8 Li beam, at Ec.m. = 10.2 MeV , was provided by the EXCYT radioactive beam facility at Catania. The beam, while passing through the helium thick target decreases its energy, thus exploring the 8 Li -α center-of-mass energy range 2.7 MeV ≤ECM ≤9.6 MeV . Four Δ E - E silicon detector telescopes were used to detect the recoiling alpha particles. The time interval between the 8 Li passing through a micro-channel plate foil, placed at the entrance of the chamber, and the detection of the α particles by the Δ E detectors was also measured. The time measurement allows to disentangle elastic from reactions events, otherwise impossible from energy measurements. This can be considered as an improvement of the TTIK method. In this paper the used experimental technique and the obtained preliminary results will be presented.

Elastic Scattering in Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 252-253
Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
Elastic Scattering ◽  
Cross Section ◽  
Quantum Noise ◽  
Dark Field ◽  
Elastic Cross Section ◽  
Biological Molecules ◽  
Dark Field Microscopy ◽  
Field Systems ◽  
Effects Of Radiation

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.

The Resolution and Contrast in Biological Sections Determined by Inelastic and Elastic Scattering

1973 ◽  
Vol 31 ◽  
pp. 224-225
Author(s):  
D. L. Misell
Keyword(s):  
Electron Microscopy ◽  
Adverse Effect ◽  
Elastic Scattering ◽  
Inelastic Scattering ◽  
Amorphous Carbon ◽  
Polymeric Materials ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Quantitative Estimates ◽  
Elastic Ratio

In the electron microscopy of biological sections the adverse effect of chromatic aberration on image resolution is well known. In this paper calculations are presented for the inelastic and elastic image intensities using a wave-optical formulation. Quantitative estimates of the deterioration in image resolution as a result of chromatic aberration are presented as an alternative to geometric calculations. The predominance of inelastic scattering in the unstained biological and polymeric materials is shown by the inelastic to elastic ratio, I/E, within an objective aperture of 0.005 rad for amorphous carbon of a thickness, t=50nm, typical of biological sections; E=200keV, I/E=16.

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

A Base Specific Single Heavy Atom Stain for Electron Microscopy

1972 ◽  
Vol 30 ◽  
pp. 184-185
Author(s):  
J. P. Langmore ◽  
N. R. Cozzarelli ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
High Resolution ◽  
Elastic Scattering ◽  
Heavy Atom ◽  
High Vacuum ◽  
Heavy Atoms ◽  
Large Movement ◽  
Base Sequencing ◽  
Scanning Electron

A system has been developed to allow highly specific derivatization of the thymine bases of DNA with mercurial compounds wich should be visible in the high resolution scanning electron microscope. Three problems must be completely solved before this staining system will be useful for base sequencing by electron microscopy: 1) the staining must be shown to be highly specific for one base, 2) the stained DNA must remain intact in a high vacuum on a thin support film suitable for microscopy, 3) the arrangement of heavy atoms on the DNA must be determined by the elastic scattering of electrons in the microscope without loss or large movement of heavy atoms.

Sign in / Sign up

Export Citation Format

Share Document