The analysis of the leakage current of polycrystalline silicon thin-film transistors as a function of active layer thickness

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Vol 42 (2) ◽  
pp. 101-105 ◽  
Author(s):  
H. Sehil ◽  
N.M. Rahmani ◽  
F. Raoult
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pp. 1307-1311 ◽  
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Yu-Mi Kim ◽  
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Seung-Dong Yang ◽  
Ho-Jin Yun ◽  
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2001 ◽  
Vol 40 (Part 2, No. 1A/B) ◽  
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Mutsumi Kimura ◽  
Ryoichi Nozawa ◽  
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Tatsuya Shimoda

2013 ◽  
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pp. 10MA01 ◽  
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Chang Woo Byun ◽  
Se Wan Son ◽  
Yong Woo Lee ◽  
Jae Hyo Park ◽  
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2012 ◽  
Vol 100 (17) ◽  
pp. 173501 ◽  
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