The analysis of the leakage current of polycrystalline silicon thin-film transistors as a function of active layer thickness
1995 ◽
Vol 42
(2)
◽
pp. 101-105
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2011 ◽
Vol 58
(5(1))
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pp. 1307-1311
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Keyword(s):
Keyword(s):
2001 ◽
Vol 40
(Part 2, No. 1A/B)
◽
pp. L26-L28
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2001 ◽
Vol 45
(2)
◽
pp. 365-368
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2015 ◽
Vol 15
(1)
◽
pp. 82-85
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1993 ◽
Vol 34
(1)
◽
pp. 62-67
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2013 ◽
Vol 52
(10S)
◽
pp. 10MA01
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Keyword(s):
2007 ◽
Vol 54
(9)
◽
pp. 2546-2550
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Keyword(s):
Keyword(s):