Radiation damage and copper distribution in 14 MeV copper-ion-implanted nickel — TEM and AEM analyses in cross-section

1989 ◽  
Vol 29 (1-4) ◽  
pp. 284-290 ◽  
Author(s):  
L.M. Wang ◽  
R.A. Dodd ◽  
G.L. Kulcinski
Author(s):  
Shawn Williams ◽  
Xiaodong Zhang ◽  
Susan Lamm ◽  
Jack Van’t Hof

The Scanning Transmission X-ray Microscope (STXM) is well suited for investigating metaphase chromosome structure. The absorption cross-section of soft x-rays having energies between the carbon and oxygen K edges (284 - 531 eV) is 6 - 9.5 times greater for organic specimens than for water, which permits one to examine unstained, wet biological specimens with resolution superior to that attainable using visible light. The attenuation length of the x-rays is suitable for imaging micron thick specimens without sectioning. This large difference in cross-section yields good specimen contrast, so that fewer soft x-rays than electrons are required to image wet biological specimens at a given resolution. But most imaging techniques delivering better resolution than visible light produce radiation damage. Soft x-rays are known to be very effective in damaging biological specimens. The STXM is constructed to minimize specimen dose, but it is important to measure the actual damage induced as a function of dose in order to determine the dose range within which radiation damage does not compromise image quality.


1974 ◽  
Vol 21 (1) ◽  
pp. 51-59 ◽  
Author(s):  
M. Gettings ◽  
O. Meyer ◽  
G. Linker

Author(s):  
W. Wesch ◽  
A. Heft ◽  
J. Heindl ◽  
H.P. Strunk ◽  
T. Bachmann ◽  
...  

Author(s):  
H.P Gunnlaugsson ◽  
M Fanciulli ◽  
M Dietrich ◽  
K Bharuth-Ram ◽  
R Sielemann ◽  
...  

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