Depth selective microstructural analysis of ion implanted metals by cross-section transmission electron microscopy and computer simulation

ABSTRACTHydrogen can influence the behaviour of materials significantly. The effects of hydrogen are specially pronounced in high fugacities of hydrogen which can occur at the surface of steels in contact with certain aqueous environments. In this investigation the effect of high fugacity hydrogen on the surface of stainless steel was investigated using electrochemical cathodic charging. Microhardness was measured on the cross section. Transmission electron microscopy was used to investigate the dislocation substructure just below the surface. Computer simulation using finite element method was carried out to estimate the extent and severity of the deformation. The significance of the results are discussed in relation to the loss of ductility due to hydrogen.

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Characterization of Ion Implanted Silicon by Spectroscopic Ellipsometry and Cross Section Transmission Electron Microscopy

MRS Proceedings ◽

10.1557/proc-27-299 ◽

1983 ◽

Vol 27 ◽

Cited By ~ 3

Author(s):

P. J. Mcmarr ◽

K. Vedam ◽

J. Narayan

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Cross Section ◽

Cross Sections ◽

Spectroscopic Ellipsometry ◽

Dose Range ◽

Depth Profiles ◽

Transmission Electron ◽

Ion Implanted

ABSTRACTThis paper deals with the application of spectroscopic ellipsometry (SE) and cross-section transmission electron microscopy (XTEM), to the characterization of damaged surface layers in ion implanted Si single crystal. Si samples of 2–6Ω·cm resistivity and <100> orientation were implanted with 28Si+ ions in the dose range of 1.0 × 1016–1.5 × 1016 ions/cm2 using ion energies of 100 and 200 keV. Ion current densities were varied from 6 to 200 μA/cm2. Depth profiles of the implanted samples were evaluated from the spectroscopic ellipsometry data. These calculated profiles were compared with the TEM micrographs of the cross sections of the samples. Excellent agreement is obtained between the two characterization techniques. The characteristics of the depth profiles of the samples, as established by the two techniques, is shown to be the result of annealing occuring during implantation.

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Microstructural Analysis of SiO2-Al2O3 Glasses

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100055059 ◽

1982 ◽

Vol 40 ◽

pp. 562-563

Author(s):

C. M. Jantzen ◽

D. G. Howitt

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microstructural Analysis ◽

Liquid Immiscibility ◽

Metastable Region ◽

Transmission Electron ◽

Liquidus Temperatures

The mullite-SiO2 liquidus has been extensively studied, and it has been shown that the flattening of the liquidus is related to the existence of a metastable region of liquid immiscibility at sub-liquidus temperatures which is detectable by transmission electron microscopy (TEM) (Fig. 1).

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Microstructure of laser-irradiated, conducting Kapton polyimide

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100138889 ◽

1995 ◽

Vol 53 ◽

pp. 502-503

Author(s):

D. L. Callahan ◽

Z. Ball ◽

H. M. Phillips ◽

R. Sauerbrey

Keyword(s):

Electron Microscopy ◽

Phase Transition ◽

Transmission Electron Microscopy ◽

Cross Section ◽

Film Surface ◽

Cross Sectional ◽

General Utility ◽

Transmission Electron ◽

Considerable Debate ◽

Potential Applications

Ultraviolet laser-irradiation can be used to induce an insulator-to-conductor phase transition on the surface of Kapton polyimide. Such structures have potential applications as resistors or conductors for VLSI applications as well as general utility electrodes. Although the percolative nature of the phase transformation has been well-established, there has been little definitive work on the mechanism or extent of transformation. In particular, there has been considerable debate about whether or not the transition is primarily photothermal in nature, as we propose, or photochemical. In this study, cross-sectional optical microscopy and transmission electron microscopy are utilized to characterize the nature of microstructural changes associated with the laser-induced pyrolysis of polyimide.Laser-modified polyimide samples initially 12 μm thick were prepared in cross-section by standard ultramicrotomy. Resulting contraction in parallel to the film surface has led to distortions in apparent magnification. The scale bars shown are calibrated for the direction normal to the film surface only.

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The use of an energy-filtering electron microscope to reduce chromatic aberration in images of thick biological specimens

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100142116 ◽

1986 ◽

Vol 44 ◽

pp. 88-91

Author(s):

L. D. Peachey ◽

J. P. Heath ◽

G. Lamprecht

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Beam ◽

Cross Section ◽

Electron Scattering ◽

Chromatic Aberration ◽

Image Resolution ◽

Incident Electron Energy ◽

Energy Filtering ◽

Transmission Electron

Biological specimens of cells and tissues generally are considerably thicker than ideal for high resolution transmission electron microscopy. Actual image resolution achieved is limited by chromatic aberration in the image forming electron lenses combined with significant energy loss in the electron beam due to inelastic scattering in the specimen. Increased accelerating voltages (HVEM, IVEM) have been used to reduce the adverse effects of chromatic aberration by decreasing the electron scattering cross-section of the elements in the specimen and by increasing the incident electron energy.

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TEM Characterization of As-Deposited and Annealed Ni/Al Multilayer Thin Film

Microscopy and Microanalysis ◽

10.1017/s143192761009392x ◽

2010 ◽

Vol 16 (6) ◽

pp. 662-669 ◽

Cited By ~ 8

Author(s):

S. Simões ◽

F. Viana ◽

A.S. Ramos ◽

M.T. Vieira ◽

M.F. Vieira

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Transmission Electron Microscopy ◽

Cross Section ◽

Ion Beam ◽

Microstructural Characterization ◽

Multilayer Thin Films ◽

Tem Analysis ◽

Plan View ◽

Transmission Electron

AbstractReactive multilayer thin films that undergo highly exothermic reactions are attractive choices for applications in ignition, propulsion, and joining systems. Ni/Al reactive multilayer thin films were deposited by dc magnetron sputtering with a period of 14 nm. The microstructure of the as-deposited and heat-treated Ni/Al multilayers was studied by transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in plan view and in cross section. The cross-section samples for TEM and STEM were prepared by focused ion beam lift-out technique. TEM analysis indicates that the as-deposited samples were composed of Ni and Al. High-resolution TEM images reveal the presence of NiAl in small localized regions. Microstructural characterization shows that heat treating at 450 and 700°C transforms the Ni/Al multilayered structure into equiaxed NiAl fine grains.

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