X-ray Standing Waves and the critical sample thickness for Total-reflection
1991 ◽
Vol 46
(10)
◽
pp. 1433-1436
◽
1993 ◽
Vol 32
(Part 1, No. 10)
◽
pp. 4750-4751
◽
Characterization of Near Surface Layers by Means of Total Reflection X-Ray Fluorescence Spectrometry
1991 ◽
Vol 35
(B)
◽
pp. 941-946
◽
Keyword(s):
X Ray
◽
2003 ◽
Vol 107
◽
pp. 203-206
◽
1986 ◽
Vol 149
(05)
◽
pp. 69-103
◽
2015 ◽
2015 ◽
2020 ◽