Effect of insulator sleeve contamination on the low energy plasma focus performance

1994 ◽  
Vol 23 (4) ◽  
pp. 359-365 ◽  
Author(s):  
M. Zakaullah ◽  
Imtiaz Ahmad ◽  
G. Murtaza ◽  
M. Yasin ◽  
M.M. Beg
1995 ◽  
Vol 4 (1) ◽  
pp. 117-124 ◽  
Author(s):  
M Zakaullah ◽  
G Murtaza ◽  
I Ahmad ◽  
F N Beg ◽  
M M Beg ◽  
...  

Pramana ◽  
1991 ◽  
Vol 37 (1) ◽  
pp. 93-103 ◽  
Author(s):  
R K Rout ◽  
A Shyam
Keyword(s):  

2000 ◽  
Vol 14 (15) ◽  
pp. 563-570 ◽  
Author(s):  
M. ZAKAULLAH ◽  
IJAZ AKHTAR ◽  
S. F. MEHMOOD ◽  
A. WAHEED ◽  
G. MURTAZA

A time-resolved rugged X-ray detector (XRD) which may be used in intense radiation environment is developed. The detector is used to study the X-ray emission from a low-energy (2.3 kJ) Mather-type plasma focus energized by a 32 μF single capacitor, using hydrogen and argon (3:2) mixture as gas filling. In the detector, the electron emitter is made of nickel and aluminum. The sensitivity of the detector with nickel cathode is found to be very low. No signal could be recorded by masking the detector with even the 2 μm thick Al foil. When Al cathode is used in the XRD, the sensitivity of the detector increases abruptly. To stop the optical/ultraviolet radiation from approaching the active area, it is masked with 6 μm Al filter. It is found that an XRD with nickel cathode is not useful for X-ray detection in a low-energy plasma focus. However, due to its excellent response to vacuum ultraviolet radiation (≤600 Å), it may find application in the study of the axial rundown of current sheath, and its velocity. The X-ray emission from focus plasma is the highest at 0.5 mbar. With increase in pressure, the emission is dropped. At filling pressures of 2.0–2.5 mbar, the X-ray emission increases again. High X-ray emission at 0.5 mbar is due to interaction of energetic electrons in the current sheath with the anode surface, whereas moderately high emission at 2.0–2.5 mbar is caused by an axially moving shockwave.


2001 ◽  
Author(s):  
Patricio Silva ◽  
Leopoldo Soto ◽  
Gustavo Sylvester ◽  
Marcelo Zambra ◽  
Horacio Bruzzone ◽  
...  

1997 ◽  
Vol 25 (3) ◽  
pp. 455-459 ◽  
Author(s):  
H. Kelly ◽  
A. Lepone ◽  
A. Marquez

2022 ◽  
pp. 152399
Author(s):  
F.M. Aghamir ◽  
A.R. Momen-Baghdadabad ◽  
W. Mamaani-Mamaan

2020 ◽  
Vol 2 (3) ◽  
pp. 035001
Author(s):  
Farid Sedighi ◽  
Ardavan Kouhi ◽  
Davoud Iraji ◽  
Chapar Rasouli ◽  
Babak Shirani Bidabadi ◽  
...  

2002 ◽  
Vol 16 (09) ◽  
pp. 309-318 ◽  
Author(s):  
M. SHAFIQ ◽  
SARTAJ ◽  
S. HUSSAIN ◽  
M. SHARIF ◽  
S. AHMAD ◽  
...  

A study of soft X-ray emission in the 1.0–1.5 keV energy range from a low energy (1.15 kJ) plasma focus has been conducted. X-rays are detected with the combination of Quantrad Si PIN-diodes masked with Al (50 μm), Mg (100 μm) and Ni (17.5 μm) filters and with a pinhole camera. The X-ray flux is found to be measurable within the pressure range of 0.1–1.0 mbar nitrogen. In the 1.0–1.3 keV and 1.0–1.5 keV windows, the X-ray yield in 4π-geometry is 1.03 J and 14.0-J, respectively, at a filling pressure of 0.25 mbar and the corresponding efficiencies are 0.04% and 1.22%. The total X-ray emission in 4π-geometry is 21.8 J, which corresponds to the system efficiency of about 1.9%. The X-ray emission is found dominantly as a result of the interaction of energetic electrons in the current sheath with the anode tip. Images recorded by the pinhole camera confirm the emission of X-rays from the tip of the anode.


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