OXYGEN TRANSPORT STUDIED BY 18O LABELLING IN THIN THERMAL SILICON OXIDE FILMS IN CONNECTION WITH THEIR STRUCTURAL CHARACTERISTICS
1985 ◽
Vol 132
(8)
◽
pp. 2012-2019
◽
Keyword(s):
1970 ◽
Vol 117
(2)
◽
pp. 272
◽
2018 ◽
Vol 24
(S1)
◽
pp. 1810-1811
◽
Keyword(s):