A transmission electron microscopy study on the crystal structure and atomic arrangement of Al–Nd thin films deposited on glass substrates

Applied Surface Science ◽

10.1016/j.apsusc.2008.06.188 ◽

2008 ◽

Vol 255 (5) ◽

pp. 2104-2108

Author(s):

Yu Jin Park ◽

Hyuk Nyun Kim ◽

Hyun Ho Shin

Keyword(s):

Crystal Structure ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Atomic Arrangement ◽

Glass Substrates ◽

Transmission Electron

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High‐resolution transmission electron microscopy study of solid phase crystallized silicon thin films on SiO2: Crystal growth and defects formation

Journal of Applied Physics ◽

10.1063/1.359359 ◽

1995 ◽

Vol 77 (1) ◽

pp. 95-102 ◽

Author(s):

J. H. Kim ◽

J. Y. Lee ◽

K. S. Nam

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Crystal Growth ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Silicon Thin Films ◽

Transmission Electron

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Oblique growth of iron thin films on glass: a cross-sectional transmission electron microscopy study

Thin Solid Films ◽

10.1016/0040-6090(95)06552-0 ◽

1995 ◽

Vol 263 (1) ◽

pp. 42-46 ◽

Author(s):

P. Fréchard ◽

S. Andrieu ◽

D. Chateigner ◽

M. Hallouis ◽

P. Germi ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Cross Sectional ◽

Transmission Electron

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Thermal stability of SrFeO3/Al2O3 thin films: Transmission electron microscopy study and conductometric sensing response

Journal of Applied Physics ◽

10.1063/1.2957073 ◽

2008 ◽

Vol 104 (2) ◽

pp. 023530 ◽

Author(s):

Dashan Wang ◽

James J. Tunney ◽

Xiaomei Du ◽

Michael L. Post ◽

Raynald Gauvin

Keyword(s):

Electron Microscopy ◽

Thermal Stability ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Thermal Stability Of

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Transmission Electron Microscopy Study of FeHfN Thin Films for Magnetic Properties Optimization and Integration Above Silicon Circuits.

Microscopy and Microanalysis ◽

10.1017/s1431927605501922 ◽

2005 ◽

Vol 11 (S02) ◽

Author(s):

R Pantel ◽

S Couderc ◽

P Ancey ◽

C Wyon ◽

B Viala

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Magnetic Properties ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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High-resolution transmission electron microscopy study of chemically deposited cadmium sulphide thin films from aqueous ammonia solutions

Philosophical Magazine B ◽

10.1080/01418639308226399 ◽

1993 ◽

Vol 68 (2) ◽

pp. 185-194 ◽

Author(s):

Daniel Lincot ◽

RaÚL Ortega-Borges ◽

Michel Froment

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Aqueous Ammonia ◽

Cadmium Sulphide ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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High-resolution transmission electron microscopy study on the solid-phase crystallization of amorphous SrBi2Ta2O9 thin films on Si

Journal of Crystal Growth ◽

10.1016/s0022-0248(00)01000-9 ◽

2001 ◽

Vol 223 (1-2) ◽

pp. 161-168 ◽

Author(s):

Jae Hyoung Choi ◽

Jeong Yong Lee ◽

Yong Tae Kim

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Solid Phase Crystallization ◽

Transmission Electron

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Cross-sectional transmission electron microscopy study of obliquely evaporated silicon oxide thin films

Thin Solid Films ◽

10.1016/0040-6090(86)90292-0 ◽

1986 ◽

Vol 136 (2) ◽

pp. L35-L38 ◽

Author(s):

O. Geszti ◽

L. Gosztola ◽

É. Seyfried

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Silicon Oxide ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Oxide Thin Films ◽

Transmission Electron Microscopy Study ◽

Cross Sectional ◽

Transmission Electron

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A transmission electron microscopy study of the crystallization of ion-beam-mixed Pd80Si20 amorphous thin films

Thin Solid Films ◽

10.1016/0040-6090(88)90490-7 ◽

1988 ◽

Vol 167 (1-2) ◽

pp. 141-148

Author(s):

A.J. Janicki ◽

B.C. Giessen ◽

P.J. Grundy

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Beam ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Amorphous Thin Films ◽

Transmission Electron

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In situ high-resolution transmission electron microscopy study of interfacial reactions of Cu thin films on amorphous silicon

Applied Physics Letters ◽

10.1063/1.2179143 ◽

2006 ◽

Vol 88 (8) ◽

pp. 083117 ◽

Author(s):

Sung Bo Lee ◽

Duck-Kyun Choi ◽

Fritz Phillipp ◽

Kyung-Sook Jeon ◽

Chang Kyung Kim

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Amorphous Silicon ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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On spinodal decomposition in Cu–34 at.% Ta thin films – An atom probe tomography and transmission electron microscopy study

Acta Materialia ◽

10.1016/j.actamat.2015.01.073 ◽

2015 ◽

Vol 89 ◽

pp. 181-192 ◽

Author(s):

Claudia M. Müller ◽

Alla S. Sologubenko ◽

Stephan S.A. Gerstl ◽

Ralph Spolenak

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Spinodal Decomposition ◽

Atom Probe Tomography ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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