High-resolution transmission electron microscopy study on the solid-phase crystallization of amorphous SrBi2Ta2O9 thin films on Si

Journal of Crystal Growth ◽

10.1016/s0022-0248(00)01000-9 ◽

2001 ◽

Vol 223 (1-2) ◽

pp. 161-168 ◽

Author(s):

Jae Hyoung Choi ◽

Jeong Yong Lee ◽

Yong Tae Kim

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Solid Phase Crystallization ◽

Transmission Electron

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High‐resolution transmission electron microscopy study of solid phase crystallized silicon thin films on SiO2: Crystal growth and defects formation

Journal of Applied Physics ◽

10.1063/1.359359 ◽

1995 ◽

Vol 77 (1) ◽

pp. 95-102 ◽

Author(s):

J. H. Kim ◽

J. Y. Lee ◽

K. S. Nam

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Crystal Growth ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Silicon Thin Films ◽

Transmission Electron

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High-resolution transmission electron microscopy study of chemically deposited cadmium sulphide thin films from aqueous ammonia solutions

Philosophical Magazine B ◽

10.1080/01418639308226399 ◽

1993 ◽

Vol 68 (2) ◽

pp. 185-194 ◽

Author(s):

Daniel Lincot ◽

RaÚL Ortega-Borges ◽

Michel Froment

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Aqueous Ammonia ◽

Cadmium Sulphide ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In situ high-resolution transmission electron microscopy study of interfacial reactions of Cu thin films on amorphous silicon

Applied Physics Letters ◽

10.1063/1.2179143 ◽

2006 ◽

Vol 88 (8) ◽

pp. 083117 ◽

Author(s):

Sung Bo Lee ◽

Duck-Kyun Choi ◽

Fritz Phillipp ◽

Kyung-Sook Jeon ◽

Chang Kyung Kim

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Amorphous Silicon ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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High-resolution transmission electron microscopy study on strained epitaxial manganite thin films and heterostructures

Journal of Magnetism and Magnetic Materials ◽

10.1016/s0304-8853(99)00707-6 ◽

2000 ◽

Vol 211 (1-3) ◽

pp. 16-21 ◽

Author(s):

B Wiedenhorst ◽

C Höfener ◽

Yafeng Lu ◽

J Klein ◽

M.S.R Rao ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

Philosophical Magazine A ◽

10.1080/01418610110087291 ◽

2002 ◽

Vol 82 (4) ◽

pp. 735-749 ◽

Author(s):

J. Y.Huang ◽

B. H. Park ◽

David Jan ◽

X. Q. Pan ◽

Yuntian T. Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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An in-situ and ex-situ transmission electron microscopy study of the substrate orientational dependence of the solid-phase epitaxial growth of amorphized GaAs

1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings ◽

10.1109/commad.1996.610160 ◽

2002 ◽

Author(s):

K.B. Belay ◽

M.C. Ridgway ◽

D.J. Llewellyn

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Epitaxial Growth ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Ex Situ ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Oblique growth of iron thin films on glass: a cross-sectional transmission electron microscopy study

Thin Solid Films ◽

10.1016/0040-6090(95)06552-0 ◽

1995 ◽

Vol 263 (1) ◽

pp. 42-46 ◽

Author(s):

P. Fréchard ◽

S. Andrieu ◽

D. Chateigner ◽

M. Hallouis ◽

P. Germi ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Cross Sectional ◽

Transmission Electron

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High-resolution transmission electron microscopy study of ordered or disordered arrangements of Cu, C and N in the charge-reservoir blocks of a series of high-Tc superconductors: (Cu, C, N)Sr2Can-1CunOy (n = 1–6)

Philosophical Magazine B ◽

10.1080/13642810110079682 ◽

2001 ◽

Vol 81 (11) ◽

pp. 1847-1860

Author(s):

Yoshihiro Anan ◽

Toru Asaka ◽

Eiji Takayama-Muromachi ◽

Koji Kimoto ◽

Yoshio Matsui

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

High Tc Superconductors ◽

Transmission Electron Microscopy Study ◽

High Tc ◽

Transmission Electron ◽

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A transmission electron microscopy study on the crystal structure and atomic arrangement of Al–Nd thin films deposited on glass substrates

Applied Surface Science ◽

10.1016/j.apsusc.2008.06.188 ◽

2008 ◽

Vol 255 (5) ◽

pp. 2104-2108

Author(s):

Yu Jin Park ◽

Hyuk Nyun Kim ◽

Hyun Ho Shin

Keyword(s):

Crystal Structure ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Atomic Arrangement ◽

Glass Substrates ◽

Transmission Electron

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Thermal stability of SrFeO3/Al2O3 thin films: Transmission electron microscopy study and conductometric sensing response

Journal of Applied Physics ◽

10.1063/1.2957073 ◽

2008 ◽

Vol 104 (2) ◽

pp. 023530 ◽

Author(s):

Dashan Wang ◽

James J. Tunney ◽

Xiaomei Du ◽

Michael L. Post ◽

Raynald Gauvin

Keyword(s):

Electron Microscopy ◽

Thermal Stability ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Thermal Stability Of

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