Type-II characteristics of photoluminescence from InGaAs/GaAs surface quantum dots due to Fermi level pinning effect

2021 ◽  
pp. 152066
Author(s):  
Xiaohui Liu ◽  
Jingtao Liu ◽  
Baolai Liang ◽  
Ying Wang ◽  
Yingnan Guo ◽  
...  
2003 ◽  
Vol 93 (7) ◽  
pp. 4169-4172 ◽  
Author(s):  
Peng Jin ◽  
X. Q. Meng ◽  
Z. Y. Zhang ◽  
C. M. Li ◽  
B. Xu ◽  
...  

2000 ◽  
Vol 29 (5) ◽  
pp. 504-509
Author(s):  
C. Walther ◽  
R. P. Blum ◽  
H. Niehus ◽  
A. Thamm ◽  
W. T. Masselink

2008 ◽  
Vol 85 (1) ◽  
pp. 2-8 ◽  
Author(s):  
Huang-Chun Wen ◽  
Prashant Majhi ◽  
Kisik Choi ◽  
C.S. Park ◽  
Husam N. Alshareef ◽  
...  

2014 ◽  
Vol 105 (7) ◽  
pp. 073508 ◽  
Author(s):  
Seung-heon Chris Baek ◽  
Yu-Jin Seo ◽  
Joong Gun Oh ◽  
Min Gyu Albert Park ◽  
Jae Hoon Bong ◽  
...  

2016 ◽  
Vol 4 (4) ◽  
pp. 704-712 ◽  
Author(s):  
Brian P. Bloom ◽  
Madu N. Mendis ◽  
Emil Wierzbinski ◽  
David H. Waldeck

Through a systematic approach we show that the insertion of a thin alumina layer in between a PbS QD layer and an Au substrate can eliminate Fermi level pinning.


2000 ◽  
Vol 5 (S1) ◽  
pp. 936-942 ◽  
Author(s):  
H. Witte ◽  
A. Krtschil ◽  
M. Lisker ◽  
D. Rudloff ◽  
J. Christen ◽  
...  

In GaN layers grown by molecular beam epitaxy as well as metal organic vapor phase epitaxy significant differences were found in the appearance of deep defects detected by thermal admittance spectroscopy as compared for deep level transient spectroscopy measurements. While, thermal admittance spectroscopy measurements which were made under zero bias conditions only show thermal emissions at activation energies between 130 and 170 meV, further deep levels existing in these GaN layers were evidenced by transient spectrocopy. This discrepancy is explained by a pinning effect of the Fermi level at the metal / GaN interface induced by high a concentration of the deep levels showing up in thermal admittance spectroscopy. We compare our results with a GaAs:Te Schottky- diode as a refernec sample. Here, both spectroscopic methods give exactly the same deep level emissions.


2018 ◽  
Vol 20 (33) ◽  
pp. 21732-21738 ◽  
Author(s):  
Nanshu Liu ◽  
Si Zhou ◽  
Nan Gao ◽  
Jijun Zhao

Monolayer gallium selenide (GaSe), an emerging two-dimensional semiconductor, holds great promise for electronics and optoelectronics.


1999 ◽  
Vol 595 ◽  
Author(s):  
H. Witte ◽  
A. Krtschil ◽  
M. Lisker ◽  
D. Rudloff ◽  
J. Christen ◽  
...  

AbstractIn GaN layers grown by molecular beam epitaxy as well as metal organic vapor phase epitaxy significant differences were found in the appearance of deep defects de-tected by thermal admittance spectroscopy as compared for deep level transient spectros-copy measurements. While, thermal admittance spectroscopy measurements which were made under zero bias conditions only show thermal emissions at activation energies between 130 and 170 meV, further deep levels existing in these GaN layers were evidenced by transient spectrocopy. This discrepancy is explained by a pinning effect of the Fermi level at the metal / GaN interface induced by high a concentration of the deep levels showing up in thermal admittance spectroscopy. We compare our results with a GaAs:Te Schottky- diode as a refernec sample. Here, both spectroscopic methods give exactly the same deep level emissions.


1991 ◽  
Vol 26 (6) ◽  
pp. K129-K135 ◽  
Author(s):  
N. B. Pyshnaya ◽  
S. I. Radatsan ◽  
I. M. Tiginyanu ◽  
V. V. Ursaki ◽  
V. A. Ursu ◽  
...  

1999 ◽  
Vol 60 (20) ◽  
pp. R13962-R13965 ◽  
Author(s):  
C. Walther ◽  
R. P. Blum ◽  
H. Niehus ◽  
W. T. Masselink ◽  
A. Thamm

Sign in / Sign up

Export Citation Format

Share Document