High mechanical and electrical reliability of bottom-gate microcrystalline silicon thin film transistors on polyimide substrate
2011 ◽
Vol 11
(1)
◽
pp. S266-S270
◽
2008 ◽
Vol 52
(3)
◽
pp. 432-435
◽
Keyword(s):
Keyword(s):
Keyword(s):