Charge carrier transport in high purity perylene single crystal studied by time-of-flight measurements and through field effect transistor characteristics

2006 ◽  
Vol 325 (1) ◽  
pp. 160-169 ◽  
Author(s):  
Masahiro Kotani ◽  
Koji Kakinuma ◽  
Masafumi Yoshimura ◽  
Kouta Ishii ◽  
Saori Yamazaki ◽  
...  
2020 ◽  
Vol 264 ◽  
pp. 116382
Author(s):  
Andrius Aukštuolis ◽  
Nerijus Nekrašas ◽  
Kristijonas Genevičius ◽  
Jūratė Jonikaitė-Švėgždienė

Nanoscale ◽  
2019 ◽  
Vol 11 (37) ◽  
pp. 17368-17375 ◽  
Author(s):  
Inyong Moon ◽  
Sungwon Lee ◽  
Myeongjin Lee ◽  
Changsik Kim ◽  
Daehee Seol ◽  
...  

WSe2 FET oxidized by plasma. Channel resistance decreases exponentially with increasing WSe2 work function, approaching thermal limit.


2016 ◽  
Vol 52 (11) ◽  
pp. 2370-2373 ◽  
Author(s):  
Jian Deng ◽  
Yuanxiang Xu ◽  
Liqun Liu ◽  
Cunfang Feng ◽  
Jia Tang ◽  
...  

Ambipolar OFETs based on AIE-active materials were demonstrated to have a high and balanced mobility level of 2.0 cm2 V−1 s−1.


2016 ◽  
Vol 16 (4) ◽  
pp. 3267-3272
Author(s):  
Masatoshi Sakai ◽  
Norifumi Moritoshi ◽  
Shigekazu Kuniyoshi ◽  
Hiroshi Yamauchi ◽  
Kazuhiro Kudo ◽  
...  

The effect of an applied gate electric field on the charge-order phase in β-(BEDT-TTF)2PF6 single-crystal field-effect transistor structure was observed at around room temperature by technical improvement with respect to sample preparation and electrical measurements. A relatively slight but systematic increase of the electrical conductance induced by the applied gate electric field and its temperature dependence was observed at around the metal-insulator transition temperature (TMI). The temperature dependence of the modulated electrical conductance demonstrated that TMI was shifted toward the lower side by application of a gate electric field, which corresponds to partial dissolution of the charge-order phase. The thickness of the partially dissolved charge order region was estimated to be several score times larger than the charge accumulation region.


2010 ◽  
Vol 107 (2) ◽  
pp. 024101 ◽  
Author(s):  
Meiyong Liao ◽  
Yasuhito Gotoh ◽  
Hiroshi Tsuji ◽  
Kiyomi Nakajima ◽  
Masataka Imura ◽  
...  

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