scholarly journals Lifetime prediction based on Gamma processes from accelerated degradation data

2015 ◽  
Vol 28 (1) ◽  
pp. 172-179 ◽  
Author(s):  
Haowei Wang ◽  
Tingxue Xu ◽  
Qiaoli Mi
2017 ◽  
Vol 28 (5) ◽  
pp. 1028-1038 ◽  
Author(s):  
Zhongyi Cai ◽  
◽  
Yunxiang Chen ◽  
Qiang Zhang ◽  
Huachun Xiang ◽  
...  

2020 ◽  
Vol 107 ◽  
pp. 113602 ◽  
Author(s):  
Zhenan Pang ◽  
XiaoSheng Si ◽  
Changhua Hu ◽  
Jianxun Zhang ◽  
Hong Pei

Author(s):  
Alex Davila-Frias ◽  
Val Marinov ◽  
Om Prakash Yadav ◽  
Yuriy Atanasov

Abstract Accelerated life testing (ALT) has been a common choice to study the effects of environmental stresses on flexible hybrid electronics (FHE), a promising technology to produce flexible electronic devices. Nevertheless, accelerated degradation testing (ADT) has proven to be a more effective approach, which does not require failure occurrences, allowing shorter testing times. Since FHE devices are expected to be highly reliable, ADT provides useful information in the form of degradation data for further analysis without actual failure data. In this paper, we present the design and experimental setup of ADT for FHE considering two stress factors simultaneously. We use daisy-chain resistance as a measurable degradation characteristic to periodically monitor the degradation of FHE products under accelerated stress conditions. Two stress factors, temperature and humidity, are considered and ADT was carried out considering four combinations of temperature and humidity simultaneously. Failure analysis was performed on failed units to investigate the failure process and location of the failure. The ADT data was used to fit in the appropriate mathematical degradation model representing the failure process. The data analysis showed faster degradation paths for higher stress combinations. Finally, we present insights and further research opportunities to expand the work.


Author(s):  
Li Sun ◽  
Fangchao Zhao ◽  
Narayanaswamy Balakrishnan ◽  
Honggen Zhou ◽  
Xiaohui Gu

Remaining useful life (RUL) prediction in real operating environment (ROE) plays an important role in condition-based maintenance. However, the life information in ROE is limited, especially for some long-life products. In such cases, accelerated degradation test (ADT) is an effective method to collect data and then the accelerated degradation data are converted to normal level of accelerated stresses through acceleration factors. However, the stresses in ROE are different from normal stresses since there are some other stresses except normal stresses, which cannot be accelerated, but still have impact on the degradation. To predict the RUL in ROE, a nonlinear Wiener degradation model is proposed based on failure mechanism invariant principle which is the precondition and requirement of an ADT and a calibration factor is introduced to calibrate the difference between ROE and normal stresses. Moreover, the unit-to-unit variability is considered in the concern model. Based upon the proposed approach, the RUL distribution is derived in closed form. The unknown parameters in the model are obtained by a new two-step method through fuzing converted degradation data in normal stresses and degradation data in ROE. Finally, the validity of the proposed model is demonstrated through several simulation data and a case study.


2013 ◽  
Vol 401-403 ◽  
pp. 1499-1502
Author(s):  
Ai Li Liu ◽  
Fang Yong Kou ◽  
Kun Hu Kou

In order to develop the reliability assessment of high-reliability and long-lifetime products, analyses for accelerated degradation test is discussed in this article. First, a method of building degradation path is presented; second, the means of degradation data processing is analyzed; finally, an example is presented and validity of this method is verified.


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