Study on Reliability Assessment of Degradation Date Based on Pseudo Life Distribution

2013 ◽  
Vol 401-403 ◽  
pp. 1499-1502
Author(s):  
Ai Li Liu ◽  
Fang Yong Kou ◽  
Kun Hu Kou

In order to develop the reliability assessment of high-reliability and long-lifetime products, analyses for accelerated degradation test is discussed in this article. First, a method of building degradation path is presented; second, the means of degradation data processing is analyzed; finally, an example is presented and validity of this method is verified.

2014 ◽  
Vol 933 ◽  
pp. 784-788 ◽  
Author(s):  
Jun Sheng Wang ◽  
Yi Zhou He ◽  
Yi Dong Wang ◽  
Wei Hua Liu

Focus on solving the life and reliability problems of long-life and high reliability products, a method of modeling and parameter estimation on reliability evaluation and life prediction with accelerated degradation data was proposed in this paper. In the first, three statistical methods of degradation test were analyzed, then according to the features of accelerated degradation data, the statistical model of degradation data based on pseudo-life was established. This method can effectively utilize the horizontal information of degradation data of product under different accelerated stress level, and integrate the advantage that continuous-time function model fits the degradation curve of product strongly, and improve the accuracy of reliability assessment and life prediction of product.


Author(s):  
Preeti Wanti Srivastava ◽  
Manisha

This article deals with the design of optimal ramp–soak–stress accelerated degradation test using Wiener process for modeling degradation paths. In an accelerated degradation test, failure occurs when the performance characteristic crosses the critical value the first time. Accelerated degradation test is incorporated in zero-failure reliability demonstration test to facilitate reduction in the test duration resulting in reduction in the test cost of high-reliability items. The parameters in model are estimated using method of maximum likelihood. The optimum plan consists in finding out optimum number of ramp–soak–stress cycles, optimum number of specimens, optimum stress change point(s), and optimum stress rates by minimizing asymptotic variance of estimate of [Formula: see text] quantile of the lifetime distribution at use condition subject to the constraint that total testing or experimental cost does not exceed a prespecified budget. An example is given to illustrate the proposed model, and sensitivity analysis is also carried out.


2014 ◽  
Vol 667 ◽  
pp. 364-367 ◽  
Author(s):  
Hui Juan Yuan ◽  
Jun Zhong Li ◽  
Zi Mei Su ◽  
En Jing Zhang ◽  
Ying Yang ◽  
...  

According to the reliability assessment of the SnO2 gas sensor, an accelerate degradation model was established by using temperature as the accelerated stress, the constant stress accelerated degradation testing (CSADT) was designed and conducted. The reliability of SnO2 gas sensor under the normal stress level was assessed based on pseudo life.


2006 ◽  
Vol 17 (2-4) ◽  
pp. 955-958 ◽  
Author(s):  
Yong-Nam Kim ◽  
Seong-Min Jeong ◽  
Min-Seok Jeon ◽  
Hyun-Gyoo Shin ◽  
Jun-Kwang Song ◽  
...  

2011 ◽  
Vol 23 (6) ◽  
pp. 1701-1704
Author(s):  
赵建印 Zhao Jianyin ◽  
刘芳 Liu Fang ◽  
奚文骏 Xi Wenjun ◽  
贺少勃 He Shaobo ◽  
魏晓峰 Wei Xiaofeng

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