Measurement, comparison and monitoring of solar mirror's specular reflectivity using two different Reflectometers

AbstractA straightforward ambient temperature route to the fabrication of surface silver-metallized polyimide films is described. Silver(I) trifluoromethane sulfonate and a polyimide, derived from 2,2-bis(3,4-dicarboxyphenyl)hexafluoropropane dianhydride (6FDA) and an equimolar amount of 4,4'-oxydianiline (ODA) and 3,5-diaminobenzoic acid (DABA), were dissolved together in dimethylacetamide. Silver(I)-doped films were prepared at thicknesses of 25-50 microns and depleted of solvent by evaporation. The silver(I)-containing films were then treated with aqueous reducing agents, which brought forth silvered films exhibiting conductivity on the order of bulk polycrystalline silver and good specular reflectivity.

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Specular reflectivity studies of the adsorption of halide anions on gold electrodes in 0.2 M HClO4

Journal of Electroanalytical Chemistry ◽

10.1016/s0022-0728(71)80090-6 ◽

1971 ◽

Vol 29 (2) ◽

pp. 279-291 ◽

Cited By ~ 38

Author(s):

Tsutomu Takamura ◽

Kiyoko Takamura ◽

Ernest Yeager

Keyword(s):

Gold Electrodes ◽

Halide Anions ◽

Specular Reflectivity

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X-ray specular-reflectivity study of the liquid-vapor density profile ofHe4

Physical Review B ◽

10.1103/physrevb.48.9644 ◽

1993 ◽

Vol 48 (13) ◽

pp. 9644-9659 ◽

Cited By ~ 38

Author(s):

L. B. Lurio ◽

T. A. Rabedeau ◽

P. S. Pershan ◽

Isaac F. Silvera ◽

M. Deutsch ◽

...

Keyword(s):

Density Profile ◽

Vapor Density ◽

X Ray ◽

Specular Reflectivity ◽

Liquid Vapor

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Model-independent determination of the surface scattering-length-density profile from specular reflectivity data

Journal of Applied Crystallography ◽

10.1107/s0021889891010907 ◽

1992 ◽

Vol 25 (2) ◽

pp. 129-145 ◽

Cited By ~ 42

Author(s):

J. S. Pedersen

Keyword(s):

Density Profile ◽

Fourier Transformation ◽

Scattering Length ◽

Simulated Data ◽

Limited Range ◽

Square Root ◽

Scattering Length Density ◽

Angle Scattering ◽

Specular Reflectivity ◽

Reflectivity Data

An approach for analysing neutron and X-ray specular reflectivity data from stratified media having variation in the scattering-length density near the surface is described. The method has its origin in small-angle scattering and it is composed of two steps: (i) indirect Fourier transformation [Glatter (1977). J. Appl. Cryst. 10, 415–421] giving the profile correlation function p(z) of the derivative dρ/dz of the scattering-length density; (ii) square-root deconvolution [Glatter (1981). J. Appl. Cryst. 14, 101–108] giving dρ/dz and ρ, the scattering-length-density profile. The only requirement for applying the method is that the scattering-length density varies only in a limited range. In nearly all cases the approach does not require any knowledge of the chemical composition of the surface layer and consequently incorporates a certain degree of objectivity. The method gives the smoothest profile which agrees with the experimental reflectivity data. The method is tested on simulated reflectivity data for a series of different surface profiles and subsequently used for analysing experimental data on fluorocarbon amphiphiles in water and salt solutions. The tests on simulated data show that the indirect Fourier transformation gives correlation functions agreeing very well with the corresponding functions of the original profiles. It is further demonstrated that the square-root deconvolution gives reliable results for the scattering-length-density profiles.

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Off-specular reflectivity study of sputter-deposition of platinum during growth

Physica B Condensed Matter ◽

10.1016/0921-4526(95)00908-6 ◽

1996 ◽

Vol 221 (1-4) ◽

pp. 77-85 ◽

Cited By ~ 15

Author(s):

H. You ◽

K.G. Huang ◽

R.T. Kampwirth

Keyword(s):

Sputter Deposition ◽

Specular Reflectivity

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X-ray resonant magnetic scattering from structurally and magnetically rough interfaces in multilayered systems. I. Specular reflectivity

Physical Review B ◽

10.1103/physrevb.68.224409 ◽

2003 ◽

Vol 68 (22) ◽

Cited By ~ 62

Author(s):

D. R. Lee ◽

S. K. Sinha ◽

D. Haskel ◽

Y. Choi ◽

J. C. Lang ◽

...

Keyword(s):

Magnetic Scattering ◽

X Ray ◽

Specular Reflectivity ◽

Multilayered Systems ◽

Rough Interfaces

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X-Ray Reflectivity Study of Single- and Bicrystals of Gold

MRS Proceedings ◽

10.1557/proc-208-339 ◽

1990 ◽

Vol 208 ◽

Cited By ~ 1

Author(s):

M. R. Fitzsimmons ◽

E. Burkel ◽

J. Peisl

Keyword(s):

Grain Boundary ◽

Grain Boundaries ◽

Single Crystals ◽

Diffuse Scattering ◽

Direct Evidence ◽

X Ray ◽

Specular Reflectivity ◽

Boundary Measurements

ABSTRACTX-ray reflectivity techniques have been used to characterize the surfaces of 0.4µm thick Au films epitaxially grown on single-crystals of NaCl. Measurements of both the specular and non-specular reflectivity suggest that the Au surface is very rough. The nonspecular reflectivity provides valuable information about the correlation of the heights at different points on the surface. The first in situ reflectivity study of the formation and destruction of a grain boundary shows direct evidence for the existence of diffuse scattering from the grain boundary. Measurements of several [0011 twist grain boundaries suggest that the roughness and texture of an interface depends upon the geometrical orientation of the surrounding substrates.

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