X-ray absorption and emission spectroscopy at the Hf L1 edge of hafnium-(silicon)-oxide ultra-thin films

2005 ◽  
Vol 148 (2) ◽  
pp. 75-79 ◽  
Author(s):  
Yasushi Uehara ◽  
Kazumasa Kawase ◽  
Jun’ichi Tsuchimoto ◽  
Teruo Shibano
2020 ◽  
Vol 738 ◽  
pp. 136895
Author(s):  
Ryosuke Yamamura ◽  
Taiga Suenaga ◽  
Masaki Oura ◽  
Takashi Tokushima ◽  
Osamu Takahashi

2008 ◽  
Vol 77 (3) ◽  
pp. 034704 ◽  
Author(s):  
Eiki Kabasawa ◽  
Jin Nakamura ◽  
Nobuyoshi Yamada ◽  
Kazuhiko Kuroki ◽  
Hisashi Yamazaki ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document